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C410C569J1U5HA Datasheet(PDF) 4 Page - Kemet Corporation

Part # C410C569J1U5HA
Description  Ceramic Leaded Capacitors
Download  48 Pages
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Manufacturer  KEMET [Kemet Corporation]
Direct Link  http://www.kemet.com
Logo KEMET - Kemet Corporation

C410C569J1U5HA Datasheet(HTML) 4 Page - Kemet Corporation

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CERAMIC CONFORMALLY COATED/AXIAL & RADIAL
PERFORMANCE CHARACTERISTICS FOR STANDARD AND HIGH VOLTAGE
© KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300
4
GENERAL SPECIFICATIONS
Working Voltage:
Axial (WVDC)
Radial (WVDC)
C0G – 50 & 100
50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k
X7R – 50 & 100
50, 100, 200, 500, 1k, 1.5k, 2k, 2.5k, 3k
Z5U – 50 & 100
50 & 100
Temperature Characteristics:
C0G – 0 ± 30 PPM / °C from - 55°C to + 125°C (1)
X7R – ± 15% from - 55°C to + 125°C
Z5U – + 22% / -56% from + 10°C to + 85°C
Capacitance Tolerance:
C0G – ±0.5pF, ±1%, ±2%, ±5%, ±10%
X7R – ±10%, ±20%, +80% / -20%, +100% / -0%
Z5U – ±20%, +80% / -20%
Construction:
Epoxy encapsulated - meets flame test requirements of UL
Standard 94V-0.
High-temperature solder - meets EIA RS-198, Method 302,
Condition B (260°C for 10 seconds)
Lead Material:
100% matte tin (Sn) with nickel (Ni) underplate and steel core.
Solderability:
EIA RS-198, Method 301, Solder Temperature: 230°C ±5°C.
Dwell time in solder = 7 ± ½ seconds.
Terminal Strength:
EIA RS-198, Method 303, Condition A (2.2kg)
ELECTRICAL
Capacitance @ 25°C:
Within specified tolerance and following test conditions.
C0G – > 1000pF with 1.0 vrms @ 1 kHz
£ 1000pF with 1.0 vrms @ 1 MHz
X7R – with 1.0 vrms @ 1 kHz
Z5U – with 1.0 vrms @ 1 kHz
Dissipation Factor @ 25°C:
Same test conditions as capacitance.
C0G – 0.15% maximum
X7R – 2.5% maximum
Z5U – 4.0% maximum
Insulation Resistance @ 25°C:
EIA RS-198, Method 104, Condition A <1kV
C0G – 100k Megohm or 1000 Megohm x µF, whichever is less.
£500V test @ rated voltage, ³1kV test @ 500V
X7R – 100k Megohm or 1000 Megohm x µF, whichever is less.
£500V test @ rated voltage, ³1kV test @ 500V
Z5U – 10k Megohm or 1000 Megohm x µF, whichever is less.
Dielectric Withstanding Voltage:
EIA RS-198, Method 103
£200V test @ 250% of rated voltage for 5 seconds with current
limited to 50mA.
500V test @ 150% of rated voltage for 5 seconds with current
limited to 50mA.
³1000V test @ 120% of rated voltage for 5 seconds with current
limited to 50mA.
ENVIRONMENTAL
Vibration:
EIA RS-198, Method 304, Condition D (10-2000Hz; 20g)
Shock:
EIA RS-198, Method 305, Condition I (100g)
Life Test:
EIA RS-198, Method 201, Condition D.
££ 200V
C0G – 200% of rated voltage @ +125°C
X7R – 200% of rated voltage @ +125°C
Z5U – 200% of rated voltage @ +85°C
³³ 500V
C0G – rated voltage @ +125°C
X7R – rated voltage @ +125°C
Post Test Limits @ 25°C are:
Capacitance Change:
C0G (
£ 200V) – +3% or 0.25pF, whichever is greater.
C0G (
³ 500V) – +3% or 0.50pF, whichever is greater.
X7R – + 20% of initial value (2)
Z5U – + 30% of initial value (2)
Dissipation Factor:
C0G – 0.15% maximum
X7R – 2.5% maximum
Z5U – 4.0% maximum
Insulation Resistance:
C0G – 10k Megohm or 100 Megohm x µF, whichever is less.
³1kV tested @ 500V.
X7R – 10k Megohm or 100 Megohm x µF, whichever is less.
³1kV tested @ 500V.
Z5U – 1k Megohm or 100 Megohm x µF, whichever is less.
Moisture Resistance:
EIA RS-198, Method 204, Condition A (10 cycles without
applied voltage.)
Post Test Limits @ 25°C are:
Capacitance Change:
C0G (
£ 200V) – +3% or 0.25pF, whichever is greater.
C0G (
³ 500V) – +3% or 0.50pF, whichever is greater.
X7R – + 20% of initial value (2)
Z5U – + 30% of initial value (2)
Dissipation Factor:
C0G – 0.25% maximum
X7R – 3.0% maximum
Z5U – 4.0% maximum
Insulation Resistance:
C0G – 10k Megohm or 100 Megohm x µF, whichever is less.
£500V test @ rated voltage, ³1kV test @ 500V.
X7R – 10k Megohm or 100 Megohm x µF, whichever is less.
³500V test @ rated voltage, >1kV test @ 500V.
Z5U – 1k Megohm or 100 Megohm x µF, whichever is less.
Thermal Shock:
EIA RS-198, Method 202, Condition B (C0G & X7R: -55°C to
+125°C); Condition A (Z5U: -55°C to 85°C)
(1)+53 PPM -30 PPM/ °C from +25°C to -55°C, + 60 PPM below
10pF.
(2)X7R and Z5U dielectrics exhibit aging characteristics; there-
fore, it is highly recommended that capacitors be deaged for 2
hours at 150°C and stabilized at room temperature for 48
hours before capacitance measurements are made.


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