SAA4997H datasheet(5/28 Pages) PHILIPS

Part #	SAA4997H

Description	VErtical Reconstruction IC VERIC for PALplus

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Manufacturer	PHILIPS [NXP Semiconductors]

Direct Link	http://www.nxp.com

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1996 Oct 24

5

Philips Semiconductors

Preliminary speciﬁcation

VErtical Reconstruction IC (VERIC) for

PALplus

SAA4997H

PINNING

SYMBOL

TYPE

DESCRIPTION

Y_VE_1

1

output

luminance output data bit 1

Y_VE_0

2

output

luminance output data bit 0

U_VE_1

3

output

chrominance output data bit 1 U-component

U_VE_0

4

output

chrominance output data bit 0 U-component

V_VE_1

5

output

chrominance output data bit 1 V-component

V_VE_0

6

output

chrominance output data bit 0 V-component

VSS1

7

input

ground 1

VDD1

8

input

positive supply voltage 1 (+5 V)

n.c.

9

−

not connected

n.c.

10

−

not connected

n.c.

11

−

not connected

n.c.

12

−

not connected

n.c.

13

−

not connected

n.c.

14

−

not connected

n.c.

15

−

not connected

n.c.

16

−

not connected

HREF_MA

17

input

horizontal reference

n.c.

18

−

not connected

VA_AI

19

input

vertical reference pulse related to output data

INTPOL

20

input

INTPOL = 1: PALplus interpolation active

INTPOL = 0: VERIC switched to bypass mode (standard signal)

FILM

21

input

FILM = 0: CAMERA mode

FILM = 1: FILM mode

EVEN_FIELD

22

input

EVEN_FIELD = 0: odd ﬁeld related to MACPACIC input data

EVEN_FIELD = 1: even ﬁeld related to MACPACIC input data

CLK_16B2

23

input

buffered clock input (16 MHz)

VSS2

24

input

ground 2

VDD2

25

input

positive supply voltage 2 (+5 V)

TCK

26

input

boundary scan test clock input

TMS

27

input

boundary scan test mode select input

TDI

28

input

boundary scan test data input

TDO_VE

29

output

boundary scan test data output

TRSTN

30

input

boundary scan test reset input

n.c.

31

−

not connected

n.c.

32

−

not connected

TEST1

33

tbf

test pins

TEST2

34

tbf

TEST3

35

tbf

CLK_32B3

36

input

buffered clock input (32 MHz)

VSS3

37

input

ground 3

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