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T190D256K008ASC-0200 Datasheet(PDF) 6 Page - Kemet Corporation |
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T190D256K008ASC-0200 Datasheet(HTML) 6 Page - Kemet Corporation |
6 / 28 page © KEMET Electronics Corporation, P.O. Box 5928, Greenville, SC 29606 (864) 963-6300 13.Power Dissipation The power dissipation of this device is defined by the allowable ripple current rating as listed in the part number reference tables. These ratings reflect an internal temperature rise of +50°C at the +85°C ambi- ent temperature with 40 kHz ripple life currents as specified in MIL-PRF-39006. These currents are established at these conditions, with the adjusted DC bias applied during the test. The permissible AC currents applied to these devices at conditions other than those defined for the Ripple Life Test can be derived from the following table. This table is listed as Table II, in MIL-PRF-39006/22F. The following rules apply to the ripple capability of these devices: 1. At +125°C, the rated voltage decreases to 2/3 of the +85°C rated. 2. The positive peak of the applied AC ripple voltage plus the DC bias cannot exceed the rated voltage of the device, and the DC bias minus the negative peak of the AC voltage cannot exceed the maximum allow- able reverse voltage of the device. 3. The ripple current ratings within the part number tables represents a maximum allowable internal tempera- ture rise of +50°C at 40 kHz, and at an ambient tem- perature of +85°C, and complying to rules 1 and 2. 4. The maximum allowable temperature rise decreases linearly, to a +10°C rise at +125°C. 5. The ESR decreases with increasing frequency, and the internal temperature rise is proportional the ESR of the device. 6. The "% of +85°C Rated Voltage" defines the DC bias level for the device. 14. Long-Term Stability When stabilized for measurement at standard con- ditions, capacitance will typically change within +10% -20% during a 10,000 hour life test +85°C. Dissipation factor data from 10,000 hour life tests at +85°C show that post limits (at standard conditions) are within 20% (max) of initial value at the conclusion of these tests. Leakage current is more variable than capacitance or DF; in fact, leakage current typically exhibits a logarithmic dependence in several respects. MIL-PRF-39006 permits leakage current (measured at standard conditions) to rise by 25% at 85°C over 10,000 hour life tests. 15. Failure Mode Capacitor failure may be induced by exceeding the rated conditions of forward DC voltage, reverse DC volt- age, surge voltage, surge current, power dissipation, or temperature. As with any practical device, these capaci- tors also possess an inherent, although low, failure rate when operated within the rated condition. One failure mode is by short-circuit. Minor para- metric drifts (see Section 14 “Long Term Stability”) are of no consequence in circuits suitable for wet tanta- lum capacitors. Catastrophic failure occurs as an ava- lanche in DC leakage current over a short (millisecond) time span. The failed capacitor, while called “short-cir- cuited”, may exhibit a DC resistance of 10 to 104 ohm. If a failed capacitor is in an unprotected low-imped- ance circuit, continued flow of current through the capac- itor may obviously produce severe overheating. The short-circuit failure may thereby be converted to an open-circuit failure. If the circuit does not open promptly, the over-heated capacitor may damage the circuit board or nearby components. Protection against such occur- rence is obtained by current-limiting devices or fuses provided by the circuit design. Fortunately, the inherent failure rate of KEMET wet tantalum capacitors is low, and this failure rate may be further improved by circuit design. Statistical failure rates are provided for wet tantalum capacitors. 16.Reliability Prediction The failure rate is dependent upon three important application conditions; DC voltage, ambient tempera- ture, and circuit impedance. Additional effects are attributable to the capacitance of the device and atmos- pheric and mechanical exposure of the assembled cir- cuit. The 1000 multiplier at the end converts the failure rate to parts-per-billion piece-hours. A prediction of the failure rate can be made using these application condi- tions and the formulas and tables listed in MIL-HDBK- 217F (Notice 2). 6 Frequency of applied ripple current 120 Hz 800 Hz 1kHz 10 kHz 40 kHz 100 kHz Ambient Temp (°C) Temp (°C) Temp (°C) Temp (°C) Temp (°C) Temp (°C) =55° 85° 105° 125° =55° 85° 105° 125° =55° 85° 105° 125° =55° 85° 105° 125° =55° 85° 105° 125° =55° 85° 105° 125° % of +85°C Rated Voltage 100% 0.60 0.39 -- -- 0.71 0.43 -- -- 0.72 0.45 -- -- 0.88 0.55 -- -- 1.00 0.63 -- -- 1.10 0.69 -- -- 90% 0.60 0.46 -- -- 0.71 0.55 -- -- 0.72 0.55 -- -- 0.88 0.67 -- -- 1.00 0.77 -- -- 1.10 0.85 -- -- 80% 0.60 0.52 0.35 -- 0.71 0.62 0.42 -- 0.72 0.62 0.42 -- 0.88 0.76 0.52 -- 1.00 0.87 0.59 -- 1.10 0.96 0.65 -- 70% 0.60 0.58 0.44 -- 0.71 0.69 0.52 -- 0.72 0.70 0.52 -- 0.88 0.85 0.64 -- 1.00 0.97 0.73 -- 1.10 1.07 0.80 -- +66.67% 0.60 0.60 0.46 0.27 0.71 0.71 0.55 0.32 0.72 0.72 0.55 0.32 0.88 0.88 0.68 0.40 1.00 1.00 0.77 0.32 1.10 1.10 0.85 0.50 Permissible AC Currents |
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