ENVIRONMENTAL

11. Temperature Stability

Mounted capacitors withstand extreme temperature

testing at a succession or continuous steps at

+25°C, -55°C, +25°C, +85°C, +125°C, +25°C in that

order. Capacitors are allowed to stabilize at each

temperature before measurement. Cap, DF, and

DCL are measured at each temperature; except DC

Leakage is not measured at -55°C.

Table 4 - Acceptable limits are as follows:

12. Standard Life Test

• 85°C, Rated Voltage, 2000 Hours

Post Test Performance:

a. Capacitance: within ±10% of initial value

b. DF: within initial limit

c. DC Leakage: within initial limit

d. ESR: within initial limit

13. High Temperature Life Test

• 125°C, Rated Voltage, 2000 Hours

Post Test Performance:

a. Capacitance: within ±10% of initial value

b. DF: within initial limit

c. DC Leakage: within 1.25 x initial limit

d. ESR: within 2 x initial limit

14. Storage Life Test

• 125°C, O VDC, 2000 Hours

Post Test Performance:

a. Capacitance: within ±10% of initial value

b. DF: within initial limit

c. DC Leakage: within 1.25 x initial limit

d. ESR: within 2 x initial limit

15. Thermal Shock

• Mil-Std-202, Method 107, Condition B

Minimum temperature is -55°C

Maximum temperature is +125°C

Post Test Performance:

a. Capacitance: within ±10% of initial value

b. DF: within initial limit

c. DC Leakage: within initial limit

d. ESR: within 2 x initial limit

16. Moisture Sensitivity Level (MSL)

• J-Std-020

a. Capacitance: within ±30% of initial value

b. DF: within initial limit

c. DC Leakage: within initial limit

d. ESR: within 2 x initial limit

Meets MSL 3 requirements for SnPb assembly.

17. Load Humidity

• 85°C, 85% RH, Rated Voltage, 500 Hours

a. Capacitance: within +30/-5% of initial value

b. DF: within initial limit

c. DC Leakage: within 5 x initial limit

d. ESR: within 2 x initial limit

18. ESD

• Polymer Aluminum capacitors are not sensi-

tive to Electro-Static Discharge (ESD).

19. Failure Mechanism and Reliability

The normal failure mechanism is dielectric break

down. Dielectric failure can result in high DC

Leakage current and may proceed to the level of a

short circuit. With sufficient time to charge, healing

may occur by one of two potential mechanisms. The

polymer adjacent to the dielectric fault site may over-

heat and vaporize, disconnecting the fault site from

the circuit. The polymer may also oxidize into a more

resistive material that caps the defect site in the

dielectric and reduces the flow of current.

Capacitor failure may be induced by exceeding the

rated conditions of forward DC voltage, reverse DC

voltage, surge current, power dissipation or tempera-

ture. Excessive environmental stress, such as pro-

longed or high temperature reflow processes may

also trigger dielectric failure.

20. Resistance to Solvents

• Mil-Std 202, Method 215

Post Test Performance:

a. Capacitance: within ±10% of initial value

b. DF: within initial limit

c. DC Leakage: within initial limit

d. ESR: within initial limit

e. Physical: no degradation of case, terminals or

marking

21. Fungus

• Mil-Std-810, Method 508

22. Flammability

• UL94 VO Classification

Step

Temp

∆∆Cap

DCL

DF

1

25°C

Specified

Tolerance

Catalog

Limit

Catalog

Limit

2

-55°C

15% of

initial value

N/A

Catalog

Limit

3

+25°C

5% of

initial value

Catalog

Limit

Catalog

Limit

4

+85°C

15% of

initial value

2X Catalog

Limit

Catalog

Limit

5

+125°C

20% of

initial value

2X Catalog

Limit

Catalog

Limit

6

+25°C

5% of

initial value

Catalog

Limit

Catalog

Limit

©KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300

ALUMINUM ORGANIC CAPACITORS

Performance Characteristics

61