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MPC5553MZP132 Datasheet(PDF) 9 Page - Freescale Semiconductor, Inc |
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MPC5553MZP132 Datasheet(HTML) 9 Page - Freescale Semiconductor, Inc |
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9 / 66 page  Electrical Characteristics MPC5553 Microcontroller Data Sheet, Rev. 2.0 Freescale Semiconductor 9 3.3 Package The MPC5553 is available in packaged form. Package options are listed in Section 2, “Ordering Information.” Refer to Section 4, “Mechanicals,” for pinouts and package drawings. 3.4 EMI (Electromagnetic Interference) Characteristics 3.5 ESD Characteristics Table 4. EMI Testing Specifications1 1 EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03. Qualification testing was performed on the MPC5554 and applied to the MPC5500 family as generic EMI performance data. Spec Characteristic Minimum Typical Maximum Unit 1 Scan range 0.15 — 1000 MHz 2 Operating frequency — — 132 MHz 3VDD operating voltages — 1.5 — V 4VDDSYN, VRC33, VDD33, VFLASH, VDDE operating voltages — 3.3 — V 5VPP, VDDEH, VDDA operating voltages — 5.0 — V 6 Maximum amplitude — — 142 323 2 Measured with single-chip EMI program. 3 Measured with expanded EMI program. dBuV 7 Operating temperature — — 25 oC Table 5. ESD Ratings1, 2 1 All ESD testing conforms to CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated Circuits. 2 Device failure is defined as: if after exposure to ESD pulses, the device no longer meets the device specification requirements. Complete DC parametric and functional testing will be performed per applicable device specification at room temperature followed by hot temperature, unless specified otherwise in the device specification. Characteristic Symbol Value Unit ESD for Human Body Model (HBM) 2000 V HBM circuit description R1 1500 Ω C100 pF ESD for Field Induced Charge Model (FDCM) 500 (all pins) V 750 (corner pins) Number of pulses per pin: Positive pulses (HBM) Negative pulses (HBM) — — 1 1 — — Interval of pulses — 1 second |
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