Analog Integrated Circuit Device Data

Freescale Semiconductor

11

33882

ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

DYNAMIC ELECTRICAL CHARACTERISTICS

Table 5. Dynamic Electrical Characteristics

Characteristics noted under conditions 4.75 V

≤ V

noted.

Characteristic

Symbol

Min

Typ

Max

Unit

POWER OUTPUT TIMING

Output Rise Time (27)

1.0

–

10

Output Fall Time (27)

1.0

–

10

Output Turn-ON Delay Time (28)

1.0

–

10

Output Turn-OFF Delay Time (29)

1.0

–

10

Output Short Fault Sense Time (30)

25

–

100

Output Short Fault Refresh Time (31)

3.0

4.5

6.0

ms

Output OFF Open Load Sense Time (32)

25

60

100

Output ON Open Load Sense Time (33)

3.0

–

12

ms

Output Short Fault ON Duty Cycle (34)

0.42

–

3.22

%

DIGITAL INTERFACE TIMING

SCLK Clock High Time (SCLK = 3.2 MHz) (35)

–

–

141

ns

SCLK Clock Low Time (SCLK = 3.2 MHz) (35)

–

–

141

ns

Required Setup Time (35)

–

–

140

ns

Required Setup Time (35)

–

–

50

ns

–

–

50

ns

–

–

50

ns

Notes

27.

Output Rise and Fall time measured at 10% to 90% and 90% to 10% voltage points respectively across 15

Ω resistive load to a V

BAT

28.

29.

30.

31.

32.

register. To guarantee a fault is reported on SO, the falling edge of CS must occur at least 100

µs after the faulted output is off.

33.

register. To guarantee a fault is reported on SO, the falling edge of CS must occur at least 12 ms after the faulted output is ON.

34.

35.

Parameter is not tested and values suggested are for system design consideration only in preventing the occurrence of double pulsing.