Test Load Circuit

+5V

CL

R1

R2

S1

GND

MZ

MZ

INPUTS

In

In

BM

BM

OUTPUTS

C2

C1

DUT

NOTE:

C1 and C2 are to bypass VCC to GND.

VCC

CK

OE

Philips Semiconductors Programmable Logic Devices

Product specification

PLC42VA12

CMOS programmable multi-function PLD

(42

× 105 × 12)

October 22, 1993

77

THERMAL RATINGS

SYMBOL

PARAMETER

RATINGS

UNIT

Supply voltage

–0.5 to +7

Input voltage

Output voltage

Input currents

–10 to +10

mA

Output currents

+24

mA

Operating temperature range

0 to +75

°C

Storage temperature range

–65 to +150

°C

NOTE:

1. Stresses above those listed may cause malfunction or permanent damage to the device. This

is a stress rating only. Functional operation at these or any other condition above those

indicated in the operational and programming specification of the device is not implied.

AC TEST CONDITIONS

VOLTAGE WAVEFORMS

MEASUREMENTS:

All circuit delays are measured at the +1.5V level

of inputs and outputs, unless otherwise specified.

Input Pulses

90%

10%

5ns

5ns

5ns

5ns

90%

10%

+3.0V

+3.0V

0V

0V

tR

tF

TEMPERATURE

Maximum junction

Maximum ambient

Allowable thermal

rise ambient to

junction

150

75

75