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3D3323Z-50 Datasheet(PDF) 4 Page - Data Delay Devices, Inc. |
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3D3323Z-50 Datasheet(HTML) 4 Page - Data Delay Devices, Inc. |
4 / 4 page 3D3323 SILICON DELAY LINE AUTOMATED TESTING TEST CONDITIONS INPUT: OUTPUT: Ambient Temperature: 25 oC ± 3oC Rload: 10K Ω ± 10% Supply Voltage (Vcc): 3.3V ± 0.1V Cload: 5pf ± 10% Input Pulse: High = 3.0V ± 0.1V Threshold: 1.5V (Rising & Falling) Low = 0.0V ± 0.1V Source Impedance: 50 Ω Max. 10K Ω 470 Ω 5pf Device Under Test Digital Scope Rise/Fall Time: 3.0 ns Max. (measured between 0.6V and 2.4V ) Pulse Width: PWIN = 1.25 x Total Delay Period: PERIN = 2.5 x Total Delay NOTE: The above conditions are for test only and do not in any way restrict the operation of the device. OUT1 OUT2 OUT3 OUT TRIG IN REF TRIG Figure 2: Test Setup DEVICE UNDER TEST (DUT) DIGITAL SCOPE/ TIME INTERVAL COUNTER PULSE GENERATOR COMPUTER SYSTEM PRINTER IN3 IN2 IN1 Figure 3: Timing Diagram tPLH tPHL PERIN PWIN tRISE tFALL 0.6V 0.6V 1.5V 1.5V 2.4V 2.4V 1.5V 1.5V VIH VIL VOH VOL INPUT SIGNAL OUTPUT SIGNAL Doc #06017 DATA DELAY DEVICES, INC. 4 5/10/2006 Tel: 973-773-2299 Fax: 973-773-9672 http://www.datadelay.com |
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