3D3622

Doc #06008

DATA DELAY DEVICES, INC.

7

5/8/2006

3 Mt. Prospect Ave. Clifton, NJ 07013

SILICON DEVICE AUTOMATED TESTING

TEST CONDITIONS

INPUT:

OUTPUT:

Ambient Temperature: 25

10K

Ω ± 10%

Supply Voltage (Vcc): 5.0V

± 0.1V

5pf

± 10%

Input Pulse:

High = 3.0V

± 0.1V

Threshold:

1.5V (Rising & Falling)

Low = 0.0V

± 0.1V

Source Impedance:

50

Ω Max.

10K

Ω

470

Ω

5pf

Device

Under

Test

Digital

Scope

Rise/Fall Time:

3.0 ns Max. (measured

between 0.6V and 2.4V )

Pulse Width:

Period:

NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.

OUT

TRIG

IN

REF

TRIG

Figure 8: Test Setup

DEVICE UNDER

TEST (DUT)

DIGITAL SCOPE/

TIME INTERVAL COUNTER

PULSE

GENERATOR

OUT

TRIG

COMPUTER

SYSTEM

PRINTER

Figure 9: Timing Diagram

0.6

0.6

1.5

1.5

2.4

2.4

1.5

1.5

INPUT

SIGNAL

OUTPUT

SIGNAL