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ABSOLUTE MAXIMUM RATINGS

(1)

PIN CONFIGURATION

1

2

3

4

8

7

6

5

IN+

NC

(1)

V+

OUT

IN-

GND

PREOUT

BUFIN

INA27x

INA270

INA271

SBOS381A – FEBRUARY 2007 – REVISED APRIL 2007

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with

appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be

more susceptible to damage because very small parametric changes could cause the device not to meet its published

specifications.

PACKAGE

PACKAGE

PRODUCT

PACKAGE-LEAD

DESIGNATOR

GAIN

MARKING

INA270

SO-8

D

14

I270A

INA271

SO-8

D

20

I271A

(1)

For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

INA270, INA271

UNIT

+18

V

–18 to +18

V

Common-Mode

–16 to +80

V

Analog Output:

OUT and PRE OUT Pins

GND – 0.3 to (V+) + 0.3

V

Input Current Into Any Pin

5

mA

Operating Temperature

–55 to +150

°C

Storage Temperature

–65 to +150

°C

Junction Temperature

+150

°C

ESD Ratings:

Human Body Model

3000

V

Charged-Device Model

750

V

(1)

Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may

degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond

those specified is not supported.

SO-8

Top View

NOTE (1): NC denotes no internal connection.

2

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