Philips Semiconductors Linear Products

Product specification

NE/SE5537

Sample-and-hold amplifier

August 31, 1994

886

SYMBOL

PARAMETER

TEST CONDITIONS

SE5537

NE5537

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

Min

Typ

Max

Min

Typ

Max

UNIT

1

3

2

7

mV

Full temperature range

5

10

mV

5

25

10

50

nA

Full temperature range

75

100

nA

Input impedance

Ω

Gain error

0.002

0.007

0.004

0.01

%

-10V

-11.5V

Full temperature range

0.02

0.02

%

Feedthrough attenuation

ratio at 1kHz

86

96

80

90

dB

Output impedance

0.5

2

0.5

4

Ω

Full temperature range

4

6

0.5

2.0

1.0

2.5

mV

4.5

6.5

4.5

7.5

mA

Logic and logic reference

input current

2

10

2

10

µA

Leakage current into hold

6

50

6

100

pA

Acquisition time to 0.1%

4

4

µs

20

20

µs

Hold capacitor charging

current

5

5

mA

SVRR

Supply voltage rejection

ratio

80

110

80

110

dB

Differential logic threshold

0.8

1.4

2.4

0.8

1.4

2.4

V

NOTES:

2. Hold step is sensitive to stray capacitive coupling between input logic signals and the hold capacitor. 1pF, for instance, will create an

additional 0.5mV step with a 5V logic swing and a 0.01F hold capacitor. Magnitude of the hold step is inversely proportional to hold capacitor

value.

3. Leakage current is measured at a junction temperature of 25

°C. The effects of junction temperature rise due to power dissipation or elevated

ambient can be calculated by doubling the 25

°C value for each 11°C increase in chip temperature. Leakage is guaranteed over full input

signal range.

4. These parameters guaranteed over a supply voltage range of

±5 to ±18V.