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SCAN182245A Datasheet(PDF) 9 Page - Fairchild Semiconductor |
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SCAN182245A Datasheet(HTML) 9 Page - Fairchild Semiconductor |
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9 / 13 page  9 www.fairchildsemi.com Absolute Maximum Ratings(Note 2) Recommended Operating Conditions Note 2: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 3: Either voltage limit or current limit is sufficient to protect inputs. DC Electrical Characteristics Note 4: Guaranteed not tested. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 3) −0.5V to +7.0V Input Current (Note 3) −30 mA to +5.0 mA Voltage Applied to Any Output in the Disabled or Power-Off State −0.5V to +5.5V in the HIGH State −0.5V to V CC Current Applied to Output in LOW State (Max) Twice the Rated IOL (mA) DC Latchup Source Current −500 mA Over Voltage Latchup (I/O) 10V ESD (HBM) Min. 2000V Free Air Ambient Temperature −40°C to +85°C Supply Voltage +4.5V to +5.5V Minimum Input Edge Rate ( ∆V/∆t) Data Input 50 mV/ns Enable Input 20 mV/ns Symbol Parameter VCC Min Typ Max Units Conditions VIH Input HIGH Voltage 2.0 V Recognized HIGH Signal VIL Input LOW Voltage 0.8 V Recognized LOW Signal VCD Input Clamp Diode Voltage Min −1.2 V IIN = −18 mA VOH Output HIGH Voltage Min 2.5 V IOH = −3 mA Min 2.0 V IOH = −32 mA VOL Output LOW Voltage Min 0.8 V IOL = 15 mA IIH Input HIGH Current All Others Max 5 µAV IN = 2.7V (Note 4) Max 5 µAV IN = VCC TMS, TDI Max 5 µAV IN = VCC IBVI Input HIGH Current Breakdown Test Max 7 µAV IN = 7.0V IBVIT Input HIGH Current Breakdown Test (I/O) Max 100 µAV IN = 5.5V IIL Input LOW Current All Others Max −5 µAV IN = 0.5V (Note 4) Max −5 µAV IN = 0.0V TMS, TDI Max −385 µAV IN = 0.0V VID Input Leakage Test 0.0 4.75 V IID = 1.9 µA All Other Pins Grounded IIH + IOZH Output Leakage Current Max 50 µAV OUT = 2.7V IIL + IOZL Output Leakage Current Max −50 µAV OUT = 0.5V IOZH Output Leakage Current Max 50 µAV OUT = 2.7V IOZL Output Leakage Current Max −50 µAV OUT = 0.5V IOS Output Short-Circuit Current Max −100 −275 mA VOUT = 0.0V ICEX Output HIGH Leakage Current Max 50 µAV OUT = VCC IZZ Bus Drainage Test 0.0 100 µAV OUT = 5.5V, All Others GND ICCH Power Supply Current Max 250 µAV OUT = VCC; TDI, TMS = VCC Max 1.0 mA VOUT = VCC; TDI, TMS = GND ICCL Power Supply Current Max mA VOUT = LOW; TDI, TMS = VCC Max 65.8 mA VOUT = LOW; TDI, TMS = GND ICCZ Power Supply Current Max 250 µA TDI, TMS = V CC Max 1.0 mA TDI, TMS = GND ICCT Additional ICC/Input All Other Inputs Max 2.9 mA VIN = VCC − 2.1V TDI, TMS inputs Max 3 mA VIN = VCC − 2.1V ICCD Dynamic ICC No Load Max 0.2 mA/ Outputs Open MHz One Bit Toggling, 50% Duty Cycle |
Similar Part No. - SCAN182245A |
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Similar Description - SCAN182245A |
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