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NB100ELT23LDTR2G Datasheet(PDF) 4 Page - ON Semiconductor |
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NB100ELT23LDTR2G Datasheet(HTML) 4 Page - ON Semiconductor |
4 / 8 page NB100ELT23L http://onsemi.com 4 Table 5. TTL DC CHARACTERISTICS VCC = 3.3 V, GND = 0.0 V, TA = −40°C to 85°C Symbol Characteristic Condition Min Typ Max Unit VOH Output HIGH Voltage IOH = −3.0 mA 2.4 V VOL Output LOW Voltage IOL = 24 mA 0.5 V IOS Output Short Circuit Current −180 −50 mA NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. Table 6. AC CHARACTERISTICS VCC = 3.3 V $ 5%, GND = 0.0 V (Note 4) Symbol Characteristic −40 °C 25 °C 85 °C Unit Min Typ Max Min Typ Max Min Typ Max fmax Maximum Frequency 160 160 160 MHz tPLH, tPHL Propagation Delay to Output Differential (Note 5) CL = 20 pF 1.95 2.5 2.95 1.95 2.5 2.95 1.95 2.6 3.25 ns tSK+ + tSK− − tSKPP Output−to−Output Skew++ Output−to−Output Skew− − Part−to−Part Skew (Note 6) 60 25 500 60 25 500 60 25 500 ps tJITTER Random Clock Jitter (RMS) 6.0 20 6.0 20 6.0 20 ps VPP Input Voltage Swing (Differential Configuration) 150 800 1200 150 800 1200 150 800 1200 mV tr tf Output Rise/Fall Times CL = 20 pF (0.8 V to 2.0 V) 700 300 900 1650 1000 700 300 900 1650 1000 700 300 900 1650 1000 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 4. Measured using a 750 mV source, 50% duty cycle clock source. All loading with 500 W to GND, CL = 20 pF. 5. Reference (VCC = 3.3 V ± 5%; GND = 0 V). 6. Skews are measured between outputs under identical conditions. Figure 2. TTL Output Loading Used for Device Evaluation CHARACTERISTIC TEST CL*RL AC TEST LOAD GND *CL includes fixture capacitance APPLICATION TTL RECEIVER |
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