NB100LVEP17

http://onsemi.com

6

Symbol

Characteristic

−40°C

25°C

85°C

Unit

Min

Typ

Max

Min

Typ

Max

Min

Typ

Max

(See Figures 4, 5)

600

400

300

700

500

400

600

325

250

700

500

400

550

300

200

700

500

400

mV

Propagation Delay to Output Differential

D to Q, Q

200

250

325

200

250

325

225

300

350

ps

Pulse Skew (Note 15)

Within Device Skew (Note 17)

Device−to−Device Skew (Note 17)

5

5

25

25

25

100

5

5

25

25

25

100

5

5

25

25

25

100

ps

RMS Random Clock Jitter (Note 18)

Peak−to Peak Data Dependent Jitter

(Note 19)

0.5

5

5

1

15

15

0.5

5

5

1

15

15

0.5

5

5

1

15

15

ps

Input Voltage Swing (Differential Configuration)

(Note 20)

150

800

1200

150

800

1200

150

800

1200

mV

Output Rise/Fall Times @ 50 MHz

Q, Q

(20% − 80%)

125

175

225

140

190

240

150

200

250

ps

NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit

board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared

operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit

values are applied individually under normal operating conditions and not valid simultaneously.

16.Worst case difference between Q0 and Q1 outputs.

17.Skew is measured between outputs under identical transitions.

18.Additive RMS jitter with 50% Duty Cycle Clock Signal at 2.5 GHz.

20.Input voltage swing is a single−ended measurement operating in differential mode, with minimum propagation change of 50 ps.