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NB6N11S Datasheet(PDF) 3 Page - ON Semiconductor

Part # NB6N11S
Description  3.3 V 1:2 AnyLevel TM Input to LVDS Fanout Buffer /Translator
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Manufacturer  ONSEMI [ON Semiconductor]
Direct Link  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

NB6N11S Datasheet(HTML) 3 Page - ON Semiconductor

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NB6N11S
http://onsemi.com
3
Table 2. ATTRIBUTES
Characteristics
Value
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 2 kV
> 200 V
> 1 kV
Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2)
Pb Pkg
Pb−Free Pkg
QFN−16
1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V−0 @ 0.125 in
Transistor Count
225 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
2. For additional information, see Application Note AND8003/D.
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC
Positive Power Supply
GND = 0 V
3.8
V
VIN
Positive Input
GND = 0 V
VIN ≤ VCC
3.8
V
IIN
Input Current Through RT (50 W Resistor)
Static
Surge
35
70
mA
mA
IOSC
Output Short Circuit Current
Line−to−Line (Q to Q)
Line−to−End (Q or Q to GND)
Q or Q to GND
Q to Q
Continuous
Continuous
12
24
mA
TA
Operating Temperature Range
QFN−16
−40 to +85
°C
Tstg
Storage Temperature Range
−65 to +150
°C
qJA
Thermal Resistance (Junction−to−Ambient) (Note 3)
0 lfpm
500 lfpm
QFN−16
QFN−16
41.6
35.2
°C/W
°C/W
qJC
Thermal Resistance (Junction−to−Case)
1S2P (Note 3)
QFN−16
4.0
°C/W
Tsol
Wave Solder
Pb
Pb−Free
265
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
3. JEDEC standard multilayer board − 1S2P (1 signal, 2 power) with 8 filled thermal vias under exposed pad.


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