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MC100LVEP14DTR2 Datasheet(PDF) 5 Page - ON Semiconductor |
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MC100LVEP14DTR2 Datasheet(HTML) 5 Page - ON Semiconductor |
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5 / 9 page  MC100LVEP14 http://onsemi.com 5 Table 8. DC CHARACTERISTICS, HSTL VCC = 2.375 V to 3.8 V, VEE = 0 V Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max VIH Input HIGH Voltage 1200 1200 1200 mV VIL Input LOW Voltage 400 400 400 mV NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. Table 9. AC CHARACTERISTICS VCC = 0 V, VEE = −2.375 V to −3.8 V or VCC = 2.375 V to 3.8 V; VEE = 0 V (Note 14) Symbol Characteristic −40°C 25°C 85°C Unit Min Typ Max Min Typ Max Min Typ Max VOUTPP Output Voltage Amplitude @ 2.5 GHz (Figure 2) 330 425 280 375 230 295 mV tPLH tPHL Propagation Delay to Output Differential 300 375 425 300 400 475 300 430 525 ps tskew Within−Device Skew (Note 15) Device−to−Device Skew (Note 15) 10 100 25 125 15 150 25 175 15 200 25 225 ps ts th Setup Time EN Hold Time EN 100 200 50 140 100 200 50 140 100 200 50 140 ps tJITTER CLOCK Random Jitter (RMS) @ v 1.0 GHz @ v 1.5 GHz @ v 2.0 GHz @ v 2.5 GHz 0.157 0.163 0.180 0.179 0.3 0.2 0.3 0.3 0.181 0.176 0.201 0.208 0.3 0.3 0.3 0.3 0.212 0.218 0.235 0.253 0.3 0.3 0.3 0.4 ps VPP Minimum Input Swing 150 800 1200 150 800 1200 150 800 1200 mV tr/tf Output Rise/Fall Time (20%−80%) 125 165 225 125 180 250 125 200 275 ps NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit values are applied individually under normal operating conditions and not valid simultaneously. 14.Measured using a 750 mV source, 50% duty cycle clock source. All loading with 50 W to VCC − 2.0 V. 15.Skew is measured between outputs under identical transitions. |
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