MC74HC4051A, MC74HC4052A, MC74HC4053A

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3

LOGIC DIAGRAM

MC74HC4053A

Triple Single−Pole, Double−Position Plus Common Off

X0

12

X1

13

A

11

B

10

C

9

ENABLE

6

X SWITCH

Y SWITCH

X

14

ANALOG

INPUTS/OUTPUTS

CHANNEL-SELECT

INPUTS

PIN 8 = GND

COMMON

OUTPUTS/INPUTS

L

L

L

L

H

H

H

H

X

L

L

H

H

L

L

H

H

X

L

H

L

H

L

H

L

H

X

FUNCTION TABLE − MC74HC4053A

Control Inputs

ON Channels

Enable

Select

CB

A

L

L

L

L

L

L

L

L

H

X = Don’t Care

Pinout: MC74HC4053A (Top View)

15

16

14

13

12

11

10

2

1

34567

9

8

YX

X1

X0

ABC

Y1

Y0

Z1

Z

Z0

Z0

Z0

Z0

Z1

Z1

Z1

Z1

Y0

Y0

Y1

Y1

Y0

Y0

Y1

Y1

X0

X1

X0

X1

X0

X1

X0

X1

NONE

Y0

2

Y1

1

Y

15

Z0

5

Z1

3

Z

4

Z SWITCH

NOTE: This device allows independent control of each switch.

Channel−Select Input A controls the X−Switch, Input B controls

the Y−Switch and Input C controls the Z−Switch

MAXIMUM RATINGS

Symbol

Parameter

Value

Unit

Positive DC Supply Voltage

(Referenced to GND)

– 0.5 to + 7.0

– 0.5 to + 14.0

V

Negative DC Supply Voltage (Referenced to GND)

– 7.0 to + 5.0

V

Analog Input Voltage

V

Digital Input Voltage (Referenced to GND)

V

I

DC Current, Into or Out of Any Pin

± 25

mA

Power Dissipation in Still Air,

Plastic DIP†

EIAJ/SOIC Package†

TSSOP Package†

750

500

450

mW

Storage Temperature Range

– 65 to + 150

_C

Lead Temperature, 1 mm from Case for 10 Seconds

Plastic DIP, SOIC or TSSOP Package

260

_C

Maximum ratings are those values beyond which device damage can occur. Maximum ratings

applied to the device are individual stress limit values (not normal operating conditions) and are

not valid simultaneously. If these limits are exceeded, device functional operation is not implied,

damage may occur and reliability may be affected.

†Derating — Plastic DIP: – 10 mW/

_C from 65_ to 125_C

EIAJ/SOIC Package: – 7 mW/

_C from 65_ to 125_C

TSSOP Package: − 6.1 mW/

_C from 65_ to 125_C

For high frequency or heavy load considerations, see Chapter 2 of the ON Semiconductor High−Speed CMOS Data Book (DL129/D).

This device contains protection

circuitry to guard against damage

due to high static voltages or electric

fields. However, precautions must

be taken to avoid applications of any

voltage higher than maximum rated

voltages to this high−impedance cir-

range GND

Unused inputs must always be

tied to an appropriate logic voltage

Unused outputs must be left open.