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SN74ABT18646PM Datasheet(PDF) 1 Page - Texas Instruments |
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SN74ABT18646PM Datasheet(HTML) 1 Page - Texas Instruments |
1 / 13 page SN74ABT18646 SCAN TEST DEVICE WITH 18-BIT TRANSCEIVER AND REGISTER SCBS131A – AUGUST 1992 – REVISED JANUARY 2002 1 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 D Member of the Texas Instruments Widebus Family D Compatible With IEEE Std 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Includes D-Type Flip-Flops and Control Circuitry to Provide Multiplexed Transmission of Stored and Real-Time Data D Two Boundary-Scan Cells Per I/O for Greater Flexibility D SCOPE Instruction Set – IEEE Std 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ – Parallel Signature Analysis at Inputs With Masking Option – Pseudorandom Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes 18 19 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 20 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 21 22 23 24 63 62 61 60 59 64 58 56 55 54 57 25 26 27 28 29 53 52 17 51 50 49 30 31 32 1A3 1A4 1A5 GND 1A6 1A7 1A8 1A9 VCC 2A1 2A2 2A3 GND 2A4 2A5 2A6 1B4 1B5 1B6 GND 1B7 1B8 1B9 VCC 2B1 2B2 2B3 2B4 GND 2B5 2B6 2B7 PM PACKAGE (TOP VIEW) description This scan test device with a 18-bit bus transceiver and register is a member of the Texas Instruments SCOPE testability IC family. This device supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan access to the test circuitry is accomplished via the four-wire test access port (TAP) interface. Copyright 2002, Texas Instruments Incorporated Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE and Widebus are trademarks of Texas Instruments. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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