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DESCRIPTION (CONT.)

DEVICE RATINGS

ABSOLUTE MAXIMUM RATINGS

UCC27200, UCC27201

SLUS746 – DECEMBER 2006

An on-chip bootstrap diode eliminates the external discrete diodes. Under-voltage lockout is provided for both

the high-side and the low-side drivers forcing the outputs low if the drive voltage is below the specified threshold.

Two versions of the UCC27200 are offered. The UCC27200 has high noise immune CMOS input thresholds

while the UCC27201 has TTL compatible thresholds.

Both devices are offered in 8-pin SOIC (D), PowerPad™ SOIC-8 (DDA) and SON-8 (DRM) packages.

ORDERING INFORMATION

TEMPERATURE RANGE

PowerPad™ SOIC-8

INPUT COMPATIBILITY

CMOS

UCC27200D

UCC27200DDA

UCC27200DRMT

-40°C to +140°C

TTL

UCC27201D

UCC27201DDA

UCC27201DRMT

(1)

These products are packaged in Lead (Pb)-Free and green lead finish of PdNiAu which is compatible with MSL level 1 at 255-260°C

peak reflow temperature to be compatible with either lead free or Sn/Pb soldering operations.

(2)

D (SOIC-8) and DDA (Power Pad™ SOIC-8) packages are available taped and reeled. Add R suffix to device type (e.g. UCC27200DR)

to order quantities of 2,500 devices per reel.

(3)

DRM (SON-8) package comes either in a small reel of 250 pieces as part number UCC27200DRMT, or larger reels of 3000 pieces as

part number UCC27200 DRMR.

Over operating free-air temperature, unless noted, all voltages are with respect to V

SS

(1)

PARAMETER

VALUE

UNIT

-0.3 to 20

-0.3 to 20

DC

Repetitive pulse <100 ns

DC

V

Repetitive pulse <100 ns

DC

-1 to 120

Repetitive pulse <100 ns

-5 to 120

-0.3 to 120

Voltage On HB-HS

-0.3 to 20

-40 to +150

-65 to +150

°C

Lead temperature (soldering, 10 sec.)

+300

1.3

2.7

W

3.3

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating

conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

All voltages are with respect to Vss. Currents are positive into, negative out of the specified terminal.

(3)

This data was taken using the JEDEC proposed high-K test PCB. See THERMAL CHARACTERISTICS section for details.

2

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