Electronic Components Datasheet Search |
|
ZL30123GGG2 Datasheet(PDF) 8 Page - Zarlink Semiconductor Inc |
|
ZL30123GGG2 Datasheet(HTML) 8 Page - Zarlink Semiconductor Inc |
8 / 27 page ZL30123 Data Sheet 8 Zarlink Semiconductor Inc. Status H1 dpll1_lock O Lock Indicator (LVCMOS). This is the lock indicator pin for DPLL1. This output goes high when DPLL1’s output is frequency and phase locked to the input reference. J1 dpll1_holdover O Holdover Indicator (LVCMOS). This pin goes high when DPLL1 enters the holdover mode. Serial Interface E2 sck I Clock for Serial Interface (LVCMOS). Serial interface clock. F1 si I Serial Interface Input (LVCMOS). Serial interface data input pin. G1 so O Serial Interface Output (LVCMOS). Serial interface data output pin. E3 cs_b Iu Chip Select for Serial Interface (LVCMOS). Serial interface chip select. This pin is internally pull up to Vdd. G2 int_b O Interrupt Pin (LVCMOS). Indicates a change of device status prompting the processor to read the enabled interrupt service registers (ISR). This pin is an open drain, active low and requires an external pull up to VDD. APLL Loop Filter A6 sdh_filter A External Analog PLL Loop Filter terminal. B6 filter_ref0 A Analog PLL External Loop Filter Reference. C6 filter_ref1 A Analog PLL External Loop Filter Reference. JTAG and Test J4 tdo O Test Serial Data Out (Output). JTAG serial data is output on this pin on the falling edge of tck. This pin is held in high impedance state when JTAG scan is not enabled. K2 tdi Iu Test Serial Data In (Input). JTAG serial test instructions and data are shifted in on this pin. This pin is internally pull up to Vdd. If this pin is not used then it should be left unconnected. H4 trst_b Iu Test Reset (LVCMOS). Asynchronously initializes the JTAG TAP controller by putting it in the Test-Logic-Reset state. This pin should be pulsed low on power- up to ensure that the device is in the normal functional state. This pin is internally pulled up to Vdd. If this pin is not used then it should be connected to GND. K3 tck I Test Clock (LVCMOS): Provides the clock to the JTAG test logic. If this pin is not used then it should be pulled down to GND. J3 tms Iu Test Mode Select (LVCMOS). JTAG signal that controls the state transitions of the TAP controller. This pin is internally pulled up to VDD. If this pin is not used then it should be left unconnected. Pin # Name I/O Type Description |
Similar Part No. - ZL30123GGG2 |
|
Similar Description - ZL30123GGG2 |
|
|
Link URL |
Privacy Policy |
ALLDATASHEET.COM |
Does ALLDATASHEET help your business so far? [ DONATE ] |
About Alldatasheet | Advertisement | Datasheet Upload | Contact us | Privacy Policy | Link Exchange | Manufacturer List All Rights Reserved©Alldatasheet.com |
Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
Family Site : ic2ic.com |
icmetro.com |