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SY5V1R5F200T0 Datasheet(PDF) 3 Page - Sharma Electro Components,Inc |
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SY5V1R5F200T0 Datasheet(HTML) 3 Page - Sharma Electro Components,Inc |
3 / 12 page Parameter Specification Test Method Capacitance Within tolerance specified in Class(I) the part number C ≤1000 pF: 1 MHz. ±10% Dissipation Factor Class(I) 0.5 to 5 V rms (Tan d and Q) C<30 pF: Q ≥400+20xC C>1000 pF: 1 KHz. ±10% C30 pF: Q>1000 1.0 ±0.2 V rms Class(II) Class(II) X7R: DF ≤3%, Z5U: 1 KHz. ±10%, 1.0 ±0.2 V rms DF ≤3%, Y5V: DF≤5% Insulation Resistance C ≤50,000 IR: >10 G Ohms Apply rated voltage fro 60 (IR) C ≤50,000 IR: >500 Ohms.F seconds at room temperature and normal humidity (70% max.) Dielectric There shall be no evidence Apply rated voltage (Class I) or Withstanding Voltage of damage or flash over 2.5 x rated voltage (Class II) to during the test. both terminations for 5 seconds. Charge and discharge current are less hat 50 mA. Termination No mechanical damage After soldering capacitor on Adherence the glass-epoxy PWB, 50 gms of steady pull is applied in direction of arrow for 10 seconds. ( See Figure 1) Bend Strength No mechanical damage After soldering capacitor on the glass-epoxy PWB, 2 mm of bending shall be applied for 10 seconds as shown in the drawing. ( See Figure 2) Life Test (High Class (I): Temperature Loading No more than ±3% or ±0.3 test) - Capacitance pf which ever is more. Apply 2 x rated voltage at Change Class(II): maximum operating X7R: ±10% max. temperature for 1000 hours. Z5U, Y5V: ±30% max. The surge current shall not Life Test (High Class(I) exceed 50 mA. After this, the Temperature Loading C<10 pF: Q ≥200+10xC samples shall be kept in room test) - DF or Q 10 pF ≤ C < 30 pF temperature for 24 hours Q ≥275+2xC: (Class I) or 48 hours (class II) C>30 pF: Q>350 and then measured for the Class(II) parameters indicated. X7R: DF ≤5% Z5U & Y5V: DF ≤7.5% Life Test (High 1000 M Ohms or 50 Ohms.F Temperature Loading whichever is less test) - IR Parameter Specification Test Method Moisture Resistance Class (I): Test - Capacitance No more than ±5% or ±0.5 pf change which ever is more. The capacitor shall be Class(II): subjected to 40 °C and 90 to X7R: ±10% max. 95% RH for 500 hours. After this, Z5U & Y5V: ±30% max. samples shall be Moisture Resistance Class(I) kept in room temperature for Test - Q or DF C<10 pF: Q ≥200+10xC 24 hrs. (Class I) or 48 hrs. 10 pF ≤ C < 30 pF (Class II), and them shall be Q ≥275+2xC: measured (Class I) or 48 C ≥30 pF: Q≥350 hours (Class II) and then Class(II) measured for the parameters X7R: DF ≤5% indicated. Z5U & Y5V: DF ≤7.5% Moisture Resistance 1000 M Ohms or 50 Ohms.F Test - IR whichever is less Humidity Load Test - Class (I): Capacitance change No more than ±7.5% or ±0.75 The capacitor shall be pf which ever is more. subjected to rated voltage at Class(II): 40 °C and 90 to 95 % RH for X7R: ±12.5% max. 500 hours. Surge current shall Z5U, Y5V: ±30% max. not exceed 50 mA. After this, Humidity Load Test Class(I) samples shall be kept in room Q or DF C<30 pF: Q ≥ 100+3xC temperature for 24 hrs. (Class I) C ≥ 30 pF: Q≥200 or 48 hours (Class II), and Class(II) them shall be measured X7R: DF ≤5% (Class I) or 48 hours (Class II) Z5U & Y5V: DF ≤7.5% and then measured for the Humidity Load Test - 500 M Ohms or 25 Ohms.F parameters indicated. IR whichever is less Temperature Cycling Class (I): Perform 5 cycles as follows: Test - Capacitance No more than ±2.5% or ±0.25 1. Room temperature dwell for change pf which ever is more. 15 minutes. Class(II): 2. Minimum operating X7R: ±7.5% max. temperature dwell for 30 Z5U, Y5V: ±20% max. minutes. Temperature Cycling Parts to meet the initial 3. Room temperature dwell for Test - Q or DF specifications 30 minutes. Temperature Cycling Parts to meet the initial 4. Maximum operating Test - IR specifications temperature dwell for 30 minutes. After the above testing condition, samples shall be kept in room temperature for 24 hrs. (Class I) or 48 hours (Class II), and them shall be measured (Class I) or 48 hours (class II) and then measured for the parameters indicated. Solderability Termination area shall be at The capacitors are completely least 75% covered with a new immersed for 10 ±0.5 seconds solder coating. There shall be in the molten solder with a no crack and ceramic temperature of 2 60±5°C solder. exposure of terminated Cladding material of outer- surface due to melting. electrode: Sn (~100%) Resistance to Solder No more than ±2.5% or ±0.25 The capacitors are completely Heat Test - pf which ever is more. immersed for 10 ±1.0 seconds Capacitance Change Class(II): in the molten solder with a X7R: ±7.5% max. temperature of 270±5°C solder. Z5U, Y5V: ±20% max. Preheat before immersion, Resistance to Solder Parts to meet the initial 1. 80 to 100 °C for 2 minutes Heat Test - Q or DF specifications 2. 150 to 180 °C for 2 minutes Resistance to Solder Parts to meet the initial The capacitance measurement Heat Test - IR specifications shall be made after the samples have been kept at room temperature for 24 hours. Figure 1 Figure 2 Reliability and Test Conditions First symbol Second symbol Third Symbol (a letter) (a number) (a letter) Z +10 deg. C 2 +45 deg. C A +1.0% Y -30 deg. C 4 +65 deg. C B +/- 1.5% X -55 deg. C 5 +85 deg. C C +/- 2.2% 6 +105 deg. C D +/- 3.3% 7 +125 deg. C E +/- 4.7% F +/- 7.5% P +/- 10.0% R +/- 15.0% S +/- 22.0% T +22%, -33% U +22%, -56% V +22%, -82% Class II Dielectric Code Explanation Low temperature requirement High Temperature requirement MAX. Capacitance change over temperature Sharma Ceramic Capacitors Page 3 Tel: (949)642-7324 SECI Engineers & Buyers' Guide Fax: (949)642-7327 |
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