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DCR1910V80 Datasheet(PDF) 3 Page - Dynex Semiconductor |
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DCR1910V80 Datasheet(HTML) 3 Page - Dynex Semiconductor |
3 / 9 page SEMICONDUCTOR DCR1910V85 3/9 www.dynexsemi.com DYNAMIC CHARACTERISTICS Symbol Parameter Test Conditions Min. Max. Units IRRM/IDRM Peak reverse and off-state current At VRRM/VDRM, Tcase = 125°C - 300 mA dV/dt Max. linear rate of rise of off-state voltage To 67% VDRM, Tj = 125°C, gate open - 1500 V/µs dI/dt Rate of rise of on-state current From 67% VDRM to 2x IT(AV) Repetitive 50Hz - 150 A/µs Gate source 30V, 10 Ω, Non-repetitive - 300 A/µs tr < 0.5µs, Tj = 125°C VT(TO) Threshold voltage – Low level 100A to1000A at Tcase = 125°C - 0.9 V Threshold voltage – High level 1000A to 7200A at Tcase = 125°C - 1.3 V rT On-state slope resistance – Low level 100A to 1000A at Tcase = 125°C - 0.888 m Ω On-state slope resistance – High level 1000A to 7200A at Tcase = 125°C - 0.55 m Ω tgd Delay time VD = 67% VDRM, gate source 30V, 10 Ω TBD TBD µs tr = 0.5µs, Tj = 25°C tq Turn-off time Tj = 125°C, V R = 200V, dI/dt = 1A/µs, - 1200 µs dVDR/dt = 20V/µs linear QS Stored charge IT = 2000A, Tj = 125°C, dI/dt – 1A/µs, 4800 8000 µC IL Latching current Tj = 25°C, V D = 5V TBD TBD mA IH Holding current Tj = 25°C, R G-K = ∞, ITM = 500A, IT = 5A TBD TBD mA |
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Similar Description - DCR1910V80 |
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