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ADC08B3000 Datasheet(PDF) 19 Page - National Semiconductor (TI) |
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ADC08B3000 Datasheet(HTML) 19 Page - National Semiconductor (TI) |
19 / 32 page 1.0 Functional Description (Continued) Two full-scale range settings are provided with pin 14 (FSR). A high on pin 14 causes an input full-scale range setting of 800 mV P-P, while grounding pin 14 causes an input full-scale range setting of 600 mV P-P. The full-scale range setting operates equally on both ADCs. In the Extended Control mode, the full-scale input range can be set to values between 560 mV P-P and 840 mVP-P through a serial interface. See Section 2.2 1.1.5 Clocking The ADC08B3000 must be driven with an a.c. coupled, differential clock signal. Section 2.3 describes the use of the clock input pins. To assist the user in offloading captured data from the Capture Buffer, the ADC08B3000 has an RCLK input. RCLK is a free-running clock which can be applied asynchronously to the analog input clock and can operate up to 200MHz. The data output, DRDY signals and EF flag are asserted synchronous to RCLK. See Section 1.7. 1.1.5.1 Dual-Edge Sampling One ADC samples the input on the positive edge of the input clock and the other ADC samples the same input on the other edge of the input clock. The input is thus sampled twice per input clock cycle, resulting in an overall sample rate of twice the input clock frequency. The ADC08B3000 uses dual edge sampling to achieve a sampling frequency of 3 GSPS with a 1.5 GHz input clock. The ADC08B3000 includes an automatic clock phase back- ground calibration feature which automatically and continu- ously adjusts the phase of the relative rising and falling edge pahses. This feature removes the need to manually adjust the clock phase and provides optimal ENOB performance 1.1.5.2 OutEdge Setting To help ease data capture in the SDR mode, the output data may be caused to transition on either the positive or the negative edge of the Data Ready (DRDY) Pins. This is chosen with the OutEdge input (pin 4). A high on the Out- Edge input pin causes the output data to transition on the rising edge of DRDY, while grounding this input causes the output to transition on the falling edge of DRDY. See Section 2.4.3. 1.1.7 Power Down The ADC08B3000 is in the active state when the Power Down pin (PD) is low. When the PD pin is high, the device is in the power down mode. In this power down mode the data output pins (positive and negative) including DRDY and OR +/- are put into a high impedance state and the devices power consumption is reduced to a minimal level. If the PD input is brought high while a calibration is running, the device will not go into power down until the calibration sequence is complete. However, if power is applied and PD is already high, the device will not begin the calibration sequence until the PD input goes low. If a manual calibration is requested while the device is powered down, the calibra- tion will not begin at all. That is, the manual calibration input is completely ignored in the power down state. 1.2 NORMAL/EXTENDED CONTROL The ADC08B3000 may be operated in one of two modes. In the simpler standard control mode, the user affects available configuration and control of the device through several con- trol pins. The "extended control mode" provides additional configuration and control options through a serial interface and a set of 6 registers. The two control modes are selected with pin 14 (FSR/ECE: Extended Control Enable). The choice of control modes is required to be a fixed selection and is not intended to be switched dynamically while the device is operational. Table 1 shows how several of the device features are af- fected by the control mode chosen. TABLE 1. Features and modes Feature Normal Control Mode Extended Control Mode RCLK Data transitions with rising or falling RCLK edge Selected with pin 4 Selected with the OE bit in the Configuration Register Power-On Calibration Delay Delay Selected with pin 127 Short delay only. Full-Scale Range Options (600 mV P-P or 800 mVP-P) selected with pin 14. Selected range applies to both channels. Up to 512 step adjustments over a nominal range of 560 mV to 840 mV. Selected using register 3H Input Offset Adjust Not possible ±45 mV adjustments in 512 steps using register 2h Clock Phase Adjustment Not possible The clock phase can be adjusted manually through the Coarse & Fine registers (Eh and Dh) Test Pattern Not possible A test pattern can be made present at the data outputs by programming register Fh. www.national.com 19 |
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