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74LV4066N Datasheet(PDF) 7 Page - NXP Semiconductors |
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74LV4066N Datasheet(HTML) 7 Page - NXP Semiconductors |
7 / 10 page Philips Semiconductors Product specification 74LV4066 Quad bilateral switches 1998 Jun 23 7 GND 2RL 2RL VCC VCC GND VCC nE nY/nZ nZ/nY 2RL 2RL CL oscilloscope DUT SV01681 Figure 8. Test circuit for measuring crosstalk between control and any switch. NOTE TO FIGURE 8: The crosstalk is defined as follows (oscilloscope output): V(p–p) SV01680 GND 2RL VCC channel ON Vis Vos sine–wave 0.1 mF nY/nZ nZ/nY 2RL CL dB SV01682 Figure 9. Test circuit for measuring minimum frequency response. NOTE TO FIGURE 9: Adjust input voltage to obtain 0 dBm at VOS when Fin = 1 MHz. After set-up frequency of fin is increased to obtain a reading of –3 dB at VOS. GND 2RL VCC channel ON Vis Vos fin = 1 kHz sine–wave 10 mF nY/nZ nZ/nY 2RL CL distortion meter SV01683 Figure 10. Test circuit for measuring sine-wave distortion. GND 2RL VCC channel OFF Vis Vos 0.1 mF nY/nZ nZ/nY 2RL CL dB SV01684 Figure 11. Test circuit for measuring switch “OFF” signal feed-through. |
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