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SN74ABT8646DLG4 Datasheet(PDF) 6 Page - Texas Instruments |
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SN74ABT8646DLG4 Datasheet(HTML) 6 Page - Texas Instruments |
6 / 32 page SN54ABT8646, SN74ABT8646 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS123F − AUGUST 1992 − REVISED APRIL 2004 6 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 test architecture Serial-test information is conveyed by means of a 4-wire test bus or TAP, that conforms to IEEE Standard 1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip control signals for the test structures in the device. Figure 2 shows the TAP-controller state diagram. The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK and output data changes on the falling edge of TCK. This scheme ensures that data to be captured is valid for fully one-half of the TCK cycle. The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan architecture and the relationship among the test bus, the TAP controller, and the test registers. As shown, the device contains an 8-bit instruction register and three test-data registers: a 40-bit boundary-scan register, an 11-bit boundary-control register, and a 1-bit bypass register. Test-Logic-Reset Run-Test/Idle Select-DR-Scan Capture-DR Shift-DR Exit1-DR Pause-DR Update-DR TMS = L TMS = L TMS = H TMS = L TMS = H TMS = H TMS = L TMS = H TMS = L TMS = L TMS = H TMS = L Exit2-DR Select-IR-Scan Capture-IR Shift-IR Exit1-IR Pause-IR Update-IR TMS = L TMS = L TMS = H TMS = L TMS = H TMS = H TMS = L TMS = H TMS = L Exit2-IR TMS = L TMS = H TMS = H TMS = H TMS = L TMS = H TMS = L TMS = H TMS = H TMS = H TMS = L Figure 2. TAP-Controller State Diagram |
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