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P85C220-80 Datasheet(PDF) 9 Page - Altera Corporation |
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P85C220-80 Datasheet(HTML) 9 Page - Altera Corporation |
9 / 16 page Altera Corporation 9 EP220 & EP224 Classic EPLDs Figure 3. EP220 & EP224 AC Test Circuits Test programs are used and then erased during the early stages of the device production flow. EPROM-based devices in one-time- programmable, windowless packages also contain on-board logic test circuitry to allow verification of function and AC specifications during the production flow. Software & Programming Support The EP220 is supported by the Altera MAX+PLUS II development software, Altera programming hardware, and third-party hardware. Both the EP220 and EP224 are supported by the Altera PLDshell Plus design software, third-party logic compilers (e.g., ABEL, CUPL, PLDesigner, LOG/IC, and iPLS II), and third-party programming hardware (e.g., Data I/O). f For more information on software support with PLDshell Plus, go to the PLDshell Plus/PLDasm User’s Guide (available from the Altera Literature Department). For more information on MAX+PLUS II, go to the MAX+PLUS II Programmable Logic Development System & Software Data Sheet in the Altera 1995 Data Book , or refer to MAX+PLUS II Help. Go to the Programming Hardware Data Sheet and the Programming Hardware Manufacturers Data Sheet in the Altera 1995 Data Book for information on Altera and third-party programming hardware support. Power-supply transients can affect AC measurements. Simultaneous transitions of multiple outputs should be avoided for accurate measurement. Threshold tests must not be performed under AC conditions. Large-amplitude, fast ground- current transients normally occur as the device outputs discharge the load capacitances. When these transients flow through the parasitic inductance between the device ground pin and the test-system ground, significant reductions in observable noise immunity can result. Numbers in parentheses are for the EP224 device. VCC C1 (includes JIG capacitance) 165 Ω (330 Ω) Device Output 120 Ω (200 Ω) to Test System |
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