Altera Corporation

9

EP220 & EP224 Classic EPLDs

Figure 3. EP220 & EP224 AC Test Circuits

Test programs are used and then erased during the early stages of the

device production flow. EPROM-based devices in one-time-

programmable, windowless packages also contain on-board logic test

circuitry to allow verification of function and AC specifications during the

production flow.

Software &

Programming

Support

The EP220 is supported by the Altera MAX+PLUS II development

software, Altera programming hardware, and third-party hardware. Both

the EP220 and EP224 are supported by the Altera PLDshell Plus design

software, third-party logic compilers (e.g., ABEL, CUPL, PLDesigner,

LOG/IC, and iPLS II), and third-party programming hardware (e.g., Data

I/O).

PLDshell Plus/PLDasm User’s Guide

(available from the Altera

Literature Department). For more information on MAX+PLUS II, go to

the MAX+PLUS II Programmable Logic Development System & Software Data

Sheet in the Altera 1995 Data Book , or refer to MAX+PLUS II Help. Go to

the Programming Hardware Data Sheet and the Programming Hardware

Manufacturers Data Sheet in the Altera 1995 Data Book for information on

Altera and third-party programming hardware support.

Power-supply transients can affect AC

measurements. Simultaneous transitions of

multiple outputs should be avoided for

accurate measurement. Threshold tests

must not be performed under AC

conditions. Large-amplitude, fast ground-

current transients normally occur as the

device outputs discharge the load

capacitances. When these transients flow

through the parasitic inductance between

the device ground pin and the test-system

ground, significant reductions in observable

noise immunity can result. Numbers in

parentheses are for the EP224 device.

VCC

C1 (includes

JIG capacitance)

165

Ω

(330

Ω)

Device

Output

120

Ω

(200

Ω)

to Test

System