SN0401093

DUAL INPUT BUS 9A OUTPUT SYNCHRONOUS BUCK PWM

SWITCHER WITH INTEGRATED FETs (SWIFT)

6,4 mm X 9,7 mm

Typical Size

SLVS523− OCTOBER 2004

FEATURES

at 9-A Continuous Output

Reference Accuracy

Adjustable 280 kHz to 700 kHz

Total Cost

APPLICATIONS

Power Distribution at 1.0 V

Performance DSPs, FPGAs, ASICs and

Microprocessors

Communications Infrastructure

DESCRIPTION

As a member of the SWIFT

 family of dc/dc regulators,

the SN0401093 low-input voltage high-output current

synchronous buck PWM converter integrates all

required active components. Included on the substrate

with the listed features are a true, high performance,

voltage

error

amplifier

that

enables

maximum

performance under transient conditions and flexibility in

choosing the output filter L and C components; an

under-voltage-lockout circuit to prevent start-up until

the VIN input voltage reaches 3 V; an internally and

externally set slow-start circuit to limit in-rush currents;

and a power good output useful for processor/logic

reset, fault signaling, and supply sequencing.

The SN0401093 is available in a thermally enhanced

28-pin TSSOP (PWP) PowerPAD

 package, which

eliminates bulky heatsinks.

SIMPLIFIED SCHEMATIC

PVIN

PH

BOOT

PGND

VSENSE

Output

AGND

VBIAS

Input1

SN0401093

SIMPLIFIED SCHEMATIC

COMP

Compensation

Network

VIN

3.3 V

50

55

60

65

70

75

80

85

90

95

100

0

1

2345

67

8

9

10

IO − Output Current − A

EFFICIENCY

vs

OUTPUT CURRENT

VIN = 3.3 V,

PVIN = 2.5 V,

VO = 1.8 V,

fs= 700 kHz

Input2

PowerPAD and SWIFT are trademarks of Texas Instruments.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments

semiconductor products and disclaimers thereto appears at the end of this data sheet.

www.ti.com

PRODUCTION DATA information is current as of publication date. Products

conform to specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all parameters.

Copyright

 2004, Texas Instruments Incorporated