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White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com

White Electronic Designs

WSF128K16-XXX

May 2003

Rev. 6

White Electronic Designs Corp. reserves the right to change products or specifications without notice.

SRAM AC CHARACTERISTICS

Parameter

Read Cycle

Symbol

-35

-70

Unit

Min Max Min Max

Read Cycle Time

35

70

ns

Address Access Time

35

70

ns

Output Hold from Address Change

03

ns

Chip Select Access Time

35

70

ns

Output Enable to Output Valid

20

35

ns

Chip Select to Output in Low Z

33

ns

Output Enable to Output in Low Z

00

ns

Chip Disable to Output in High Z

20

25

ns

Output Disable to Output in High Z

20

25

ns

1. This parameter is guaranteed by design but not tested.

SRAM AC CHARACTERISTICS

Parameter

Write Cycle

Symbol

-35

-70

Unit

Min Max Min Max

Write Cycle Time

35

70

ns

Chip Select to End of Write

25

60

ns

Address Valid to End of Write

25

60

ns

Data Valid to End of Write

20

30

ns

Write Pulse Width

25

50

ns

Address Setup Time

05

ns

Address Hold Time

05

ns

Output Active from End of Write

45

ns

Write Enable to Output in High Z

20

25

ns

Data Hold from Write Time

00

ns

1. This parameter is guaranteed by design but not tested.

FIGURE 3

AC Test Circuit

AC TEST CONDITIONS

Parameter

Typ

Unit

Input Pulse Levels

V

Input Rise and Fall

5

ns

Input and Output Reference Level

1.5

V

Output Timing Reference Level

1.5

V

Tester Impedance Z0 = 75Ω.

ATE tester includes jig capacitance.

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