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White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com

White Electronic Designs

WF1M32B-XXX3

March 2006

Rev. 5

White Electronic Designs Corp. reserves the right to change products or specifications without notice.

AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS – CS# CONTROLLED

Parameter

Symbol

-100

-120

-150

Unit

Min

Max

Min

Max

Min

Max

Write Cycle Time

100

120

150

ns

Write Enable Setup Time

000

ns

Chip Select Pulse Width

45

50

50

ns

Address Setup Time

000

ns

Data Setup Time

45

50

50

ns

Data Hold Time

000

ns

Address Hold Time

45

50

50

ns

Chip Select Pulse Width High

20

20

20

ns

Duration of Byte Programming Operation (1)

300

300

300

µs

Sector Erase Time

15

15

15

sec

Read Recovery Time (2)

000

µs

Chip Programming Time

50

50

50

sec

2. Guaranteed by design, but not tested.

AC TEST CIRCUIT

AC TEST CONDITIONS

Parameter

Typ

Unit

Input Pulse Levels

V

Input Rise and Fall

5

ns

Input and Output Reference Level

1.5

V

Output Timing Reference Level

1.5

V

NOTES:

Tester Impedance Z0 = 75 Ω.

ATE tester includes jig capacitance.

I

Current Source

D.U.T.

C

= 50 pf

eff

I

OL

V

(Bipolar Supply)

Z

Current Source

OH