Philips Semiconductors

Product specification

74F377A

Octal D-type flip-flop with enable

1996 Mar 12

4

ABSOLUTE MAXIMUM RATINGS

(Operation beyond the limit set forth in this table may impair the useful life of the device.

Unless otherwise noted these limits are over the operating free air temperature range.)

SYMBOL

PARAMETER

RATING

UNIT

Supply voltage

–0.5 to +7.0

V

Input voltage

–0.5 to +7.0

V

Input current

–30 to +5

mA

Voltage applied to output in High output state

V

Current applied to output in Low output state

40

mA

Operating free air temperature range

0 to +70

Storage temperature range

–65 to +150

°C

RECOMMENDED OPERATING CONDITIONS

SYMBOL

PARAMETER

LIMITS

UNIT

MIN

NOM

MAX

Supply voltage

4.5

5.0

5.5

V

High–level input voltage

2.0

V

Low–level input voltage

0.8

V

Input clamp current

–18

mA

High–level output current

–1

mA

Low–level output current

20

mA

Operating free air temperature range

0

+70

DC ELECTRICAL CHARACTERISTICS

(Over recommended operating free-air temperature range unless otherwise noted.)

SYMBOL

PARAMETER

TEST

LIMITS

UNIT

MIN

MAX

E & CP inputs

2.5

V

High-level output voltage

2.7

3.4

V

Other inputs

2.5

V

2.7

V

Low-level output voltage

0.35

0.50

V

0.35

0.50

V

Input clamp voltage

–0.73

-1.2

V

Input current at maximum input voltage

100

µA

High–level input current

20

µA

Low–level input current

–20

µA

–60

–150

mA

I

Supply current (total)

I

V

= MAX

27

40

mA

Supply current (total)

27

40

mA

29

43

mA

Notes to DC electrical characteristics

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.

3. To reduce the effect of external noise during test. Special test conditions are not necessary for the ’377A.

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting

of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any