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N74F269 Datasheet(PDF) 5 Page - NXP Semiconductors |
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N74F269 Datasheet(HTML) 5 Page - NXP Semiconductors |
5 / 14 page Philips Semiconductors Product specification 74F269 8–bit bidirectional binary counter 1996 Jan 05 5 ABSOLUTE MAXIMUM RATINGS (Operation beyond the limits set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the operating free-air temperature range.) SYMBOL PARAMETER RATING UNIT VCC Supply voltage –0.5 to +7.0 V VIN Input voltage –0.5 to +7.0 V IIN Input current –30 to +5 mA VOUT Voltage applied to output in High output state –0.5 to VCC V IOUT Current applied to output in Low output state 40 mA Tamb Operating free-air temperature range 0 to +70 °C Tstg Storage temperature –65 to +150 °C RECOMMENDED OPERATING CONDITIONS SYMBOL PARAMETER LIMITS UNIT SYMBOL PARAMETER MIN NOM MAX UNIT VCC Supply voltage 4.5 5.0 5.5 V VIH High-level input voltage 2.0 V VIL Low-level input voltage 0.8 V IIK Input clamp current –18 mA IOH High-level output current –1 mA IOL Low-level output current 20 mA Tamb Operating free-air temperature range 0 70 °C DC ELECTRICAL CHARACTERISTICS (Over recommended operating free-air temperature range unless otherwise noted.) NO TAG LIMITS SYMBOL PARAMETER TEST CONDITIONSNO TAG MIN TYP NO TAG MAX UNIT VO High level output voltage VCC = MIN, VIL = MAX ±10%VCC 2.5 V VOH High-level output voltage VIH = MIN, IOH = MAX ±5%VCC 2.7 3.4 V VO Low level output voltage VCC = MIN, VIL = MAX ±10%VCC 0.30 0.50 V VOL Low-level output voltage VIH = MIN, IOL = MAX ±5%VCC 0.30 0.50 V VIK Input clamp voltage VCC = MIN, II = IIK –0.73 –1.2 V II Input current at maximum input voltage VCC = MAX, VI = 7.0V 100 µA IIH High-level input current VCC = MAX, VI = 2.7V 20 µA IIL Low-level input current VCC = MAX, VI = 0.5V –0.6 mA IOS Short-circuit output currentNO TAG VCC = MAX –60 –150 mA ICC Supply current (total) ICCH VCC = PE=CET=CEP=U/D=GND, Pn=4.5V, CP= ↑ 93 120 mA ICC Supply current (total) ICCL CC MAX PE=CET=CEP=U/D=GND, Pn=GND, CP= ↑ 98 125 mA NOTES: 1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type. 2. All typical values are at VCC = 5V, Tamb = 25°C. 3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. |
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