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NB3L553 Datasheet(PDF) 2 Page - ON Semiconductor |
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NB3L553 Datasheet(HTML) 2 Page - ON Semiconductor |
2 / 6 page NB3L553 http://onsemi.com 2 OE 1 0 Function Enable Disable Table 1. OE, Output Enable Function PIN DESCRIPTION Pin # Name Type Description 1 VDD Power Positive supply voltage (2.375 V to 5.25 V) 2 Q0 (LV)CMOS/(LV)TTL Output Clock Output 0 3 Q1 (LV)CMOS/(LV)TTL Output Clock Output 1 4 GND Power Negative supply voltage; Connect to ground, 0 V 5 ICLK (LV)CMOS/(LV)TTL Input Clock Input. 5.0 V tolerant 6 Q2 (LV)CMOS/(LV)TTL Output Clock Output 2 7 Q3 (LV)CMOS/(LV)TTL Output Clock Output 3 8 OE (LV)CMOS/(LV)TTL Input Output Enable for the clock outputs. Outputs are enabled when HIGH: connect to VDD for normal operation; OE pin has internal pull−up resistor. Three−states out- puts when LOW. MAXIMUM RATINGS Symbol Parameter Condition 1 Condition 2 Rating Units VDD Positive Power Supply GND = 0 V − 6.0 V VI Input Voltage − − GND –0.5 ≤ VI ≤ VDD + 0.5 V TA Operating Temperature Range, Industrial − − ≥ −40 to ≤ +85 _C Tstg Storage Temperature Range − − −65 to +150 _C qJA Thermal Resistance (Junction−to−Ambient) 0 LFPM 500 LFPM SOIC−8 190 130 _C/W _C/W qJC Thermal Resistance (Junction−to−Case) (Note 1) SOIC−8 41 to 44 _C/W Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. 1. JEDEC standard multilayer board − 2S2P (2 signal, 2 power) ATTRIBUTES Characteristic Value ESD Protection Human Body Model Machine Model Charged Device Model > 2 kV > 150 V > TBD kV Moisture Sensitivity, Indefinite Time Out of Drypack (Note 2) Level 1 Flammability Rating Oxygen Index: 28 to 34 UL−94 code V−0 @ 0.125 in Transistor Count 531 Devices Meets or Exceeds JEDEC Standard EIA/JESD78 IC Latchup Test 2. For additional Moisture Sensitivity information, refer to Application Note AND8003/D. |
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