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74F1779 Datasheet(PDF) 6 Page - NXP Semiconductors

Part # 74F1779
Description  8-bit bidirectional binary counter -State
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Manufacturer  PHILIPS [NXP Semiconductors]
Direct Link  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

74F1779 Datasheet(HTML) 6 Page - NXP Semiconductors

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Philips Semiconductors
Product specification
74F1779
8-bit bidirectional binary counter (3-State)
1989 Apr 06
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
TC
VCC = MIN,
VIL = MAX
IO = 1mA
±10%VCC
2.5
V
VO
High level output voltage
TC
VIL = MAX
VIH = MIN
IOH = –1mA
±5%VCC
2.7
3.4
V
VOH
High-level output voltage
I/On
VCC = MIN,
VIL = MAX
IO = 3mA
±10%VCC
2.4
V
I/On
VIL = MAX
VIH = MIN
IOH = –3mA
±5%VCC
2.7
3.3
V
VO
Low level output voltage
VCC = MIN,
VIL = MAX
IO = MAX
±10%VCC
0.30
0.50
V
VOL
Low-level output voltage
VIL = MAX
VIH = MIN
IOL = MAX
±5%VCC
0.35
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
I
Input current at maximum
I/On
VCC = 5.5V, VI = 5.5V
1
mA
II
input voltage
others
VCC = 5.5V, VI = 7.0V
100
µA
IIH
High-level input current
except
VCC = MAX, VI = 2.7V
20
µA
IIL
Low-level input current
I/On
VCC = MAX, VI = 0.5V
–0.6
mA
IIH+IOZH
Off-state output current
High-level voltage applied
I/On
VCC = MAX, VO = 2.7V
70
µA
IIL+IOZL
Off-state output current
Low-level voltage applied
I/On
VCC = MAX, VO = 0.5V
–600
µA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICCH
100
145
mA
ICC
Supply current (total)
ICCL
VCC = MAX
100
145
mA
ICCZ
110
155
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V. Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other tests. In any sequence of
parameter tests, IOS tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
Tamb = +25°C
VCC = +5.0V
CL = 50pF, RL = 500Ω
Tamb = 0°C to +70°C
VCC = +5.0V ± 10%
CL = 50pF, RL = 500Ω
UNIT
MIN
TYP
MAX
MIN
MAX
fMAX
Maximum clock frequency
Waveform 1
115
130
100
MHz
tPLH
tPHL
Propagation delay
CP to I/On
Waveform 1
4.0
5.0
6.5
7.0
10.0
10.5
4.0
5.0
10.5
11.0
ns
tPLH
tPHL
Propagation delay
CP to TC
Waveform 1
4.0
4.5
6.5
6.5
9.0
9.0
3.5
4.0
9.5
9.5
ns
tPLH
tPHL
Propagation delay
CET to TC
Waveform 2
2.0
2.5
4.0
4.5
6.5
7.0
2.0
2.5
7.5
7.5
ns
tPZH
tPZL
Output Enable time to
High or Low level
Waveform 4
Waveform 5
2.0
4.5
4.0
6.5
6.5
9.0
2.0
4.0
7.5
9.5
ns
tPHZ
tPLZ
Output Enable time from
High or Low level
Waveform 4
Waveform 5
1.0
1.0
3.0
4.0
6.0
7.0
1.0
1.0
6.5
7.5
ns


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