IS41LV16257B

6

Integrated Silicon Solution, Inc. — 1-800-379-4774

Rev. B

04/22/05

Symbol Parameter

Test Condition

Speed

Min.

Max.

Unit

Input Leakage Current

–10

10

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–10

10

µA

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Stand-by Current: TTL

RAS, LCAS, UCAS

Com. 3.3V

—

4

mA

Stand-by Current: CMOS

RAS, LCAS, UCAS

3.3V

—

1

mA

Operating Current:

RAS, LCAS, UCAS,

-35

—

230

mA

-60

—

170

Average Power Supply Current

Operating Current:

-35

—

220

mA

-60

—

160

Average Power Supply Current

Refresh Current:

RAS Cycling, LCAS, UCAS

-35

—

230

mA

-60

—

170

Average Power Supply Current

Refresh Current:

RAS, LCAS, UCAS Cycling

-35

—

230

mA

-60

—

170

Average Power Supply Current

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight

RAS refresh cycles (RAS-Only or CBR) before proper

device operation is assured. The eight

ceeded.

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each fast page cycle.

5. Enables on-chip refresh and address counters.