IC41C4100

IC41LV4100

Integrated Circuit Solution Inc.

7

DR027-0A 09/05/2001

(Recommended Operating Conditions unless otherwise noted.)

Symbol Parameter

Test Condition

Speed Min.

Max.

Unit

Input Leakage Current

Any input 0V

–10

10

µA

Other inputs not under test = 0V

Output Leakage Current

Output is disabled (Hi-Z)

–10

10

µA

0V

Output High Voltage Level

2.4

—

V

Output Low Voltage Level

—

0.4

V

Standby Current: TTL

Commerical

5V

—

2

mA

Industrial

5V

—

3

Commerical 3.3V

—

1

Industrial

3.3V

—

2

Standby Current: CMOS

5V

—

1

mA

3.3V

—

0.5

Operating Current:

RAS, CAS,

-35

—

110

mA

-50

—

95

Average Power Supply Current

-60

—

85

Operating Current:

-35

—

90

mA

-50

—

80

Average Power Supply Current

-60

—

70

Refresh Current:

-35

—

110

mA

-50

—

95

Average Power Supply Current

-60

—

85

Refresh Current:

RAS, CAS Cycling

-35

—

110

mA

-50

—

95

Average Power Supply Current

-60

—

85

Notes:

1. An initial pause of 200 µs is required after power-up followed by eight

RAS refresh cycles (RAS-Only or CBR) before proper device

operation is assured. The eight

2. Dependent on cycle rates.

3. Specified values are obtained with minimum cycle time and the output open.

4. Column-address is changed once each EDO page cycle.

5. Enables on-chip refresh and address counters.