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HSD16M64B4W-10 Datasheet(PDF) 4 Page - Hanbit Electronics Co.,Ltd |
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HSD16M64B4W-10 Datasheet(HTML) 4 Page - Hanbit Electronics Co.,Ltd |
4 / 10 page HANBit HSD16M64B4W URL: www.hbe.co.kr 4 HANBit Electronics Co.,Ltd. REV 1.0 (August.2002) PIN FUNCTION DESCRIPTION PIN NAME INPUT FUNCTION CLK System clock Active on the positive going edge to sample all inputs. /CS Chip enable Disables or enables device operation by masking or enabling all inputs except CLK, CKE and DQM CKE Clock enable Masks system clock to freeze operation from the next clock cycle. CKE should be enabled at least one cycle prior to new command. Disable input buffers for power down in standby. CKE should be enabled 1CLK+tSS prior to valid command. A0 ~ A12 Address Row/column addresses are multiplexed on the same pins. Row address : RA0 ~ RA12, Column address : CA0 ~ CA8 BA0 ~ BA1 Bank select address Selects bank to be activated during row address latch time. Selects bank for read/write during column address latch time. /RAS Row address strobe Latches row addresses on the positive going edge of the CLK with RAS low. Enables row access & precharge. /CAS Column address strobe Latches column addresses on the positive going edge of the CLK with CAS low. Enables column access. /WE Write enable Enables write operation and row precharge. Latches data in starting from CAS, WE active. DQM0 ~ 7 Data input/output mask Makes data output Hi-Z, tSHZ after the clock and masks the output. Blocks data input when DQM active. (Byte masking) DQ0~DQ63 Data input/output Data inputs/outputs are multiplexed on the same pins. VDD/VSS Power supply/ground Power and ground for the input buffers and the core logic. ABSOLUTE MAXIMUM RATINGS PARAMETER SYMBOL RATING Voltage on Any Pin Relative to Vss VIN ,OUT -1V to 4.6V Voltage on Vcc Supply Relative to Vss Vcc -1V to 4.6V Power Dissipation PD 4W Storage Temperature TSTG -55oC to 150oC Short Circuit Output Current IOS 400mA Notes: Permanent device damage may occur if " Absolute Maximum Ratings" are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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