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EM39LV088-90H Datasheet(PDF) 9 Page - ELAN Microelectronics Corp |
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EM39LV088-90H Datasheet(HTML) 9 Page - ELAN Microelectronics Corp |
9 / 22 page EM39LV088 8M Bits (1Mx8) Flash Memory SPECIFICATION This specification is subject to change without further notice. (04.09.2004 V1.0) Page 9 of 22 DC CHARACTERISTICS (CMOS Compatible) Parameter Description Test Conditions Min Max Unit IDD Power Supply Current Read Program and Erase Address Input =VIL/VIH, at f=1/TRC Min, VDD=VDD Max CE#=OE#=VIL, WE#=VIH, all I/Os open CE#=WE#=VIL, OE#=VIH, 30 30 mA mA ISB Standby VDD Current CE#=VIHC, VDD=VDD Max 20 µA ILI ILO Input Leakage Current Output Leakage Current VIN=GND to VDD, VDD=VDD Max VOUT=GND to VDD, VDD=VDD Max 1 10 µA µA VIL VIH VIHC Input Low Voltage Input High Voltage Input High Voltage (CMOS) VDD=VDD Min VDD=VDD Max VDD=VDD Max 0.7 VDD VDD-0.3 0.8 V V V VOL VOH Output Low Voltage Output High Voltage IOL=100µA, VDD=VDD Min IOH=-100µA, VDD=VDD Min VDD-0.2 0.2 V V Table 5: DC Characteristics (Cmos Compatible) Recommended System Power-up Timing Parameter Description Min Unit TPU-READ* Power-up to Read Operation 100 µs TPU-WRITE* Power-up to Program/Erase Operation 100 µs * This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. Table 6: Recommended System Power-up Timing Capacitance (Ta=25 °C, f=1Mhz, other pins open) Parameter Description Test Conditons Max CI/O* I/O Pin Capacitance VI/O=0V 12pF CIN* Input Capacitance VIN=0V 6pF * This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. Table 7: Capacitance (Ta=25 °C, f=1Mhz, Other Pins Open) Reliability Characteristics Symbol Parameter Min Specification Unit Test Method NEND* Endurance 10,000 Cycles JEDEC Standard A117 TDR* Data Retention 10 Years JEDEC Standard A103 ILTH* Latch Up 100+IDD mA JEDEC Standard 78 * This parameter is measured only for initial qualification and after a design or process change that could affect this parameter. Table 8: Reliability Characteristics |
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