Q1

CK1

AP1

AR2

CK2

Q1

Q2

AP2

AR1

R

R

R

U

U

U

U

R

R

R

U

R

R

R

U

U

U

U

R

Q2

OPTION

CLOCK

D1/T1

D2/T2

TO

I/O

CELL

CELL

I/O

FROM

D1/T1

TO

CLOCK

OPTION

U

U

R

R

R

R

A

B

C

Logic Cell with Combinable

Sum Terms, Register to I/O Cell

Figure 9

Q1

CK1

AP1

AR2

CK2

Q1

Q2

AP2

AR1

R

R

R

U

U

U

U

R

R

R

U

R

R

R

U

U

U

U

R

Q2

CLOCK

OPTION

D1/T1

D2/T2

TO

I/O

CELL

CELL

I/O

FROM

OPTION

CLOCK

U

U

R

R

R

R

A

B

C

Logic Cell, Two Buried Registers,

Combinatorial to I/O Cell

Figure 8

D.C. Characteristics

Symbol Parameter

Condition

Min

Typ

Max

Units

Input Load Current

10

µA

Output Leakage Current

10

µA

Power Supply Current

ATV5000

Com.

200

350

mA

Ind.,Mil.

200

400

mA

Power Supply Current

ATV5000L

Com.

32

40

mA

Ind.,Mil.

32

50

mA

Clocked Power Supply

Current, ATV5000L Only

Outputs Open

Com.

30

(2)

mA

Ind.,Mil.

30

(2)

mA

(1)

Output Short Circuit

Current

-120

mA

Input Low Voltage

-0.6

0.8

V

Input High Voltage

2.0

V

Output Low Voltage

0.5

V

Output High Voltage

V

2.4

V

Notes:

1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 seconds.

ATV5000/L

1-197