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M32L1632512A
Elite Semiconductor Memory Technology Inc.
Publication Date : Jun. 2001
Revision : 1.6
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AC OPERATING TEST CONDITIONS (VDD = 3.3V
± 0.3V, TA = 0 to 70 C
° )
Parameter
Value
AC Input levels
VIH/VIL = 2.4V/0.4V
Input timing measurement reference level
1.4V
Input rise and fall-time (See note3)
tR/tF = 1ns/1ns
Output timing measurement reference level
1.4V
Output load condition
See Fig. 2
(Fig. 1) DC Output Load Circuit
(Fig. 2) AC Output Load Circuit
AC CHARACTERISTICS
(AC operating conditions unless otherwise noted)
-5/5S
-6/6S
-7/7S
-8/8S
Unit
Note
Parameter
Symbol
Min Max Min Max Min Max Min Max
CAS latency =3
5678
CLK cycle time
CAS latency =2
tCC
7.5
1000
8
1000
10
1000
12
1000
ns
1
CAS latency =3
-4.5
-5.5
-
6
-6.5
CLK to valid
output delay
CAS latency =2
tSAC
-5
-6
-7
-8
ns
1, 2
CAS latency =3
2222
ns
Output data
hold time
CAS latency =2
tOH
2222
ns
2
CLK high pulse width
tCH
2
2
2.5
3
ns
3
CLK low pulse width
tCL
2
2
2.5
3
ns
3
Input setup time
tSS
222
2.5
ns
3
Input hold time
tSH
1111
ns
3
CLK to output in Low-Z
tSLZ
1111
ns
2
CAS latency =3
-
5
-
5.5
-
6
-
6.5
CLK to output
In Hi-Z
CAS latency =2
tSHZ
-5
-6
-7
-8
ns
* All AC parameters are measured from half to half.
Output
870
VOH (DC) =2.4V , IOH = -2 mA
VOL (DC) =0.4V , IOL = 2 mA
Output
30pF
Z0 =50
30pF
50
VREF = 1.4V
3.3V
1200
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