CAT24C03

2

Doc. No. 1113, Rev. A

© 2006 by Catalyst Semiconductor, Inc.

Characteristics subject to change without notice

ABSOLUTE MAXIMUM RATINGS*

Storage Temperature

-65°C to +150°C

-0.5 V to +6.5 V

* Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,

and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification

is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.

Symbol Parameter

Min

Units

1,000,000

Program/ Erase Cycles

Data Retention

100

Years

D.C. OPERATING CHARACTERISTICS

Symbol Parameter

Test Conditions

Min

Max

Units

Supply Current

Read or Write at 400 kHz

1

mA

Standby Current

2

μA

I/O Pin Leakage

2

μA

Input Low Voltage

-0.5

V

Input High Voltage

V

Output Low Voltage

0.4

V

Output Low Voltage

0.2

V

PIN IMPEDANCE CHARACTERISTICS

Symbol Parameter

Conditions

Min

Max

Units

SDA I/O Pin Capacitance

8

pF

Input Capacitance (other pins)

6

pF

WP Input Low Impedance

5

70

kΩ

WP Input High Leakage

2

μA

Note:

(2) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100

and JEDEC test methods.