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MX29F040CQI-70G Datasheet(PDF) 17 Page - Macronix International |
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MX29F040CQI-70G Datasheet(HTML) 17 Page - Macronix International |
17 / 38 page 17 P/N:PM1201 REV. 1.0, DEC. 20, 2005 MX29F040C SWITCHING TEST CIRCUITS SWITCHING TEST WAVEFORMS for 29F040C-70 and 29F040C-90 SWITCHING TEST WAVEFORMS for 29F040C-55 DEVICE UNDER TEST DIODES=IN3064 OR EQUIVALENT CL 6.2K ohm 2.7K ohm +5V CL=100pF Including jig capacitance for 70ns and 90ns CL=30pF Including jig capacitance for 55ns 2.0V 2.0V 0.8V 0.8V TEST POINTS 0.7xVCC 0.45V AC TESTING: Inputs are driven at 0.7xVCC for a logic "1" and 0.45V for a logic "0". Input pulse rise and fall times are < 10ns. OUTPUT INPUT 1.5V 1.5V TEST POINTS 0.7xVCC 0V AC TESTING: Inputs are driven at 0.7xVCC for a logic "1" and 0V for a logic "0". Input pulse rise and fall times are < 5ns. OUTPUT INPUT |
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