Stock No. 23394-B 01/05

3

The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.

NanoAmp Solutions, Inc.

N08L163WC1C

Advance Information

Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional oper-

ation of the device at these or any other conditions above those indicated in the operating section of this specification is not implied.

Exposure to absolute maximum rating conditions for extended periods may affect reliability.

Absolute Maximum Ratings

Item

Symbol

Rating

Unit

V

–0.3 to 4.5

V

Power Dissipation

500

mW

Storage Temperature

–65 to 150

Operating Temperature

-40 to +85

Soldering Temperature and Time

Operating Characteristics (Over Specified Temperature Range)

Item

Symbol

Test Conditions

Min.

Max

Unit

Supply Voltage

2.2

3.0

3.6

V

Data Retention Voltage

Chip Disabled

1.5

V

Input High Voltage

Vcc = 2.2V to 2.7V

1.8

V

Vcc = 2.2V to 2.7V

2.2

Input Low Voltage

Vcc = 2.2V to 2.7V

–0.3

0.6

V

Vcc = 2.2V to 2.7V

-0.3

0.8

Output High Voltage

2.0

V

2.4

Output Low Voltage

0.4

V

0.4

Input Leakage Current

-1

1

µA

Output Leakage Current

-1

1

µA

Read/Write Operating Supply Current

@ 1

2. This parameter is specified with the outputs disabled to avoid external loading effects. The user must add current required to drive

output capacitance expected in the actual system.

1.5

3.0

mA

-L

1.5

3.0

Read/Write Operating Supply Current

@ fmax

12.0

20.0

mA

-L

12.0

15.0

Maximum Standby Current

Chip Disabled

2.0

20

µA

-L

2.0

8

Maximum Data Retention Current

Vcc = 1.5V, CE

≥ Vcc - 0.2V,

VIN

≥ Vcc - 0.2V or VIN ≤

0.2V

10

µA

-L

4