SRAM

AS8S512K32

& AS8S512K32A

Austin Semiconductor, Inc.

AS8S512K32 & AS8S512K32A

Rev. 3.1 12/01

Austin Semiconductor, Inc. reserves the right to change products or specifications without notice.

4

AC TEST CONDITIONS

NOTE:

1. This parameter is sampled.

OH

OL

I

I

Current Source

Current Source

Vz = 1.5V

(Bipolar

Supply)

Device

Under

Test

Ceff = 50pf

-+

+

NOTES:

Vz is programmable from -2V to + 7V.

I

Vz is typically the midpoint of V

I

circuit.

Input rise and fall times.........................................5ns

Input timing reference levels...............................1.5V

Output reference levels........................................1.5V

Output load..............................................See Figure 1

Test Specifications

SYMBOL

PARAMETER

MAX

UNITS

A0 - A18 Capacitance

50

pF

OE\ Capacitance

50

pF

WE\ and CS\ Capacitance

20

pF

I/O 0- I/O 31 Capacitance

20

pF

WE\ Capacitance

50

pF

CAPACITANCE (V

Figure 1