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ABSOLUTE MAXIMUM RATINGS

ELECTRICAL CHARACTERISTICS

DAC5672

SLAS440 – NOVEMBER 2004

over T

(1)

UNIT

Supply voltage range

-0.5 V to 4 V

-0.5 V to 4 V

Voltage between AGND and DGND

-0.5 V to 0.5 V

Voltage between AVDD and DVDD

-0.5 V to 0.5 V

Supply voltage range

-0.5 V to DVDD + 0.5 V

-0.5 V to DVDD + 0.5 V

-1.0 V to AVDD + 0.5 V

-0.5 V to AVDD + 0.5 V

Peak input current (any input)

+20 mA

Peak total input current (all inputs)

-30 mA

Operating free-air temperature range

-40

°C to 85 °C

Storage temperature range

-65

°C to 150 °C

Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds

260

°C

(1)

Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings

only and functional operation of these or any other conditions beyond those indicated under “recommended operating conditions” is not

implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

Measured with respect to AGND.

(3)

Measured with respect to DGND.

over T

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

DC Specifications

Resolution

14

Bits

INL

Integral nonlinearity

-4

±1.1

4

LSB

DNL

Differential nonlinearity

-3

±0.75

3

LSB

Analog Output

Offset error

Midscale value

±0.03

%FSR

Offset mismatch

Midscale value

±0.03

%FSR

Gain error

With external reference

±0.25

%FSR

With internal reference

±0.25

%FSR

2

mA

20

mA

Gain mismatch

With external reference

-2

0.2

2

%FSR

With internal reference

-2

0.2

2

%FSR

-1

1.25

V

Output resistance

300

k

Ω

Output capacitance

5

pF

Reference Output

Reference voltage

1.14

1.2

1.26

V

(1)

Measured differentially through 50

Ω to AGND.

(2)

(3)

The lower limit of the output compliance is determined by the CMOS process. Exceeding this limit may result in transistor breakdown,

resulting in reduced reliability of the DAC5672 device. The upper limit of the output compliance is determined by the load resistors and

full-scale output current. Exceeding the upper limit adversely affects distortion performance and integral nonlinearity.

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