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AS7C33256PFS18A Datasheet(PDF) 3 Page - Alliance Semiconductor Corporation

Part # AS7C33256PFS18A
Description  3.3V 256K16/18 pipeline burst synchronous SRAM
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Manufacturer  ALSC [Alliance Semiconductor Corporation]
Direct Link  https://www.alliancememory.com
Logo ALSC - Alliance Semiconductor Corporation

AS7C33256PFS18A Datasheet(HTML) 3 Page - Alliance Semiconductor Corporation

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AS7C33256PFS16A
AS7C33256PFS18A
3/14/01; V.1.0
Alliance Semiconductor
P. 3 of 11
Signal descriptions
Absolute maximum ratings
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions may affect reliability.
Signal
I/O
Properties
Description
CLK
I
CLOCK
Clock. All inputs except OE, FT, ZZ, LBO are synchronous to this clock.
A0–A17
I
SYNC
Address. Sampled when all chip enables are active and ADSC or ADSP are asserted.
DQ[a,b]
I/O
SYNC
Data. Driven as output when the chip is enabled and OE is active.
CE0
ISYNC
Master chip enable. Sampled on clock edges when ADSP or ADSC is active. When
CE0 is inactive, ADSP is blocked. Refer to the Synchronous Truth Table for more
information.
CE1, CE2
ISYNC
Synchronous chip enables. Active HIGH and active LOW, respectively. Sampled on
clock edges when ADSC is active or when CE0 and ADSP are active.
ADSP
ISYNC
Address strobe (processor). Asserted LOW to load a new address or to enter
standby mode.
ADSC
ISYNC
Address strobe (controller). Asserted LOW to load a new address or to enter
standby mode.
ADV
I
SYNC
Burst advance. Asserted LOW to continue burst read/write.
GWE
ISYNC
Global write enable. Asserted LOW to write all 16/18 bits. When HIGH, BWE and
BW[a,b] control write enable.
BWE
ISYNC
Byte write enable. Asserted LOW with GWE = HIGH to enable effect of BW[a,b]
inputs.
BW[a,b]
ISYNC
Write enables. Used to control write of individual bytes when GWE = HIGH and
BWE = LOW. If any of BW[a,b] is active with GWE = HIGH and BWE = LOW the
cycle is a write cycle. If all BW[a,b] are inactive, the cycle is a read cycle.
OE
IASYNC
Asynchronous output enable. I/O pins are driven when OE is active and the chip is
in read mode.
LBO
I
STATIC default =
HIGH
Count mode. When driven HIGH, count sequence follows Intel XOR convention.
When driven LOW, count sequence follows linear convention. This signal is
internally pulled HIGH.
FT
ISTATIC
Flow-through mode.When LOW, enables single register flow-through mode.
Connect to VDD if unused or for pipelined operation.
ZZ
I
ASYNC
Sleep. Places device in low power mode; data is retained. Connect to GND if
unused.
Parameter
Symbol
Min
Max
Unit
Power supply voltage relative to GND
VDD, VDDQ
–0.5
+4.6
V
Input voltage relative to GND (input pins)
VIN
–0.5
VDD + 0.5
V
Input voltage relative to GND (I/O pins)
VIN
–0.5
VDDQ + 0.5
V
Power dissipation
PD
–1.8
W
DC output current
IOUT
–50
mA
Storage temperature (plastic)
Tstg
–65
+150
°C
Temperature under bias
Tbias
–65
+135
°C


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