SN54LVTT240, SN74LVTT240

3.3-V ABT OCTAL BUFFERS/DRIVERS

WITH 3-STATE OUTPUTS

SCES005 – FEBRUARY 1995

Copyright

1

POST OFFICE BOX 655303

Technology (ABT) Design for 3.3-V

Operation and Low-Static Power

Dissipation

(5-V Input and Output Voltages With

Down to 2.7 V

Per JEDEC Standard JESD-17

Small-Outline (DW), Shrink Small-Outline

(DB), Thin Shrink Small-Outline (PW)

Packages, Ceramic Chip Carriers (FK),

Ceramic Flat (W) Packages, and Ceramic

(J) DIPs

description

These octal buffers and line drivers are designed

but with the capability to provide a TTL interface to

a 5-V system environment.

The ’LVTT240 is organized as two 4-bit buffer/line

drivers with separate output-enable (OE) inputs.

When OE is low, the device passes data from the

A inputs to the Y outputs. When OE is high, the

outputs are in the high-impedance state.

resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.

The SN74LVTT240 is available in TI’s shrink small-outline package (DB), which provides the same I/O pin count

and functionality of standard small-outline packages in less than half the printed-circuit-board area.

The SN54LVTT240 is characterized for operation over the full military temperature range of – 55

°C to 125°C.

The SN74LVTT240 is characterized for operation from – 40

°C to 85°C.

FUNCTION TABLE

(each buffer)

INPUTS

OUTPUT

OE

A

Y

L

H

L

L

LH

H

X

Z

1

2

3

4

5

6

7

8

9

10

20

19

18

17

16

15

14

13

12

11

1OE

1A1

2Y4

1A2

2Y3

1A3

2Y2

1A4

2Y1

GND

2OE

1Y1

2A4

1Y2

2A3

1Y3

2A2

1Y4

2A1

SN54LVTT240 ...J OR W PACKAGE

SN74LVTT240 . . . DB, DW, OR PW PACKAGE

(TOP VIEW)

32

1 20 19

910 11 12 13

4

5

6

7

8

18

17

16

15

14

1Y1

2A4

1Y2

2A3

1Y3

1A2

2Y3

1A3

2Y2

1A4

SN54LVTT240 . . . FK PACKAGE

(TOP VIEW)

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.