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AT22V10L-25GI Datasheet(PDF) 6 Page - ATMEL Corporation

Part # AT22V10L-25GI
Description  High Speed UV Erasable Programmable Logic Device
Download  11 Pages
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Manufacturer  ATMEL [ATMEL Corporation]
Direct Link  http://www.atmel.com
Logo ATMEL - ATMEL Corporation

AT22V10L-25GI Datasheet(HTML) 6 Page - ATMEL Corporation

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Pin Capacitance
(f = 1 MHz, T = 25°C)
(1)
Typ
Max
Units
Conditions
CIN
58
pF
VIN = 0 V
COUT
68
pF
VOUT = 0 V
Note:
1. Typical values for nominal supply voltage. This parameter is only sampled and is not 100% tested.
Power Up Reset
The registers in the AT22V10 and AT22V10L are designed to
reset during power up. At a point delayed slightly from VCC
crossing 3.8 V, all registers will be reset to the low state. The
output state will depend on the polarity of the output buffer.
This feature is critical for state machine initialization. However,
due to the asynchronous nature of reset and the uncertainty of
how VCC actually rises in the system, the following conditions
are required:
1) The VCC rise must be monotonic,
2) After reset occurs, all input and feedback setup times must be
met before driving the clock pin high, and
3) The clock must remain stable during tPR.
Parameter
Description
Min
Typ
Max
Units
tPR
Power-Up
Reset Time
600
1000
ns
CLOCK
3.8 V
POWER
REGISTERED
OUTPUTS
tS
tPR
tW
Erasure Characteristics
The entire fuse array of an AT22V10 or AT22V10L is erased
after exposure to ultraviolet light at a wavelength of 2537 Å.
Complete erasure is assured after a minimum of 20 minutes ex-
posure using 12,000
µW/cm
2 intensity lamps spaced one inch
away from the chip. Minimum erase time for lamps at other in-
tensity ratings can be calculated from the minimum integrated
erasure dose of 15 Wsec/cm
2. To prevent unintentional era-
sure, an opaque label is recommended to cover the clear window
on any UV erasable PLD which will be subjected to continuous
fluorescent indoor lighting or sunlight.
Preload of Registered Outputs
The registers in the AT22V10 and AT22V10L are provided
with circuitry to allow loading of each register asynchronously
with either a high or a low. This feature will simplify testing
since any state can be forced into the registers to control test
sequencing. A VIH level on the I/O pin will force the register
high; a VIL will force it low, independent of the polarity bit (C0)
setting. The preload state is entered by placing an 11.5-V to
13-V signal on pin 8 on DIPs, and pin 10 on SMPs. When the
clock pin is pulsed high, the data on the I/O pins is placed into
the ten registers.
CLOCK
VH
OUTPUTS
DISABLED
PRELOAD
CLOCKED IN
PRELOAD DATA
PRELOAD
REGISTERED
VOLTAGE
REMOVED
tD
tD
tD
tD
tD
OUTPUT
FORCE I/O’S
TO VIH ORVIL
PRELOAD ENA.
OUTPUTS DIS.
tDMIN = 100 ns
Level forced on
registered output pin
during preload cycle
Register state
after cycle
VIH
High
VIL
Low
1-102
AT22V10/L


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