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C222T102K2BX5CM Datasheet(PDF) 5 Page - Kemet Corporation |
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C222T102K2BX5CM Datasheet(HTML) 5 Page - Kemet Corporation |
5 / 40 page KEMET Electronics Corporation, P.O. Box 5928, Greenville, S.C. 29606, (864) 963-6300 5 KEMET ® CERAMIC CONFORMALLY COATED/AXIAL & RADIAL PERFORMANCE CHARACTERISTICS GENERAL SPECIFICATIONS Working Voltage: Axial Radial C0G 50 & 100 volts 100 & 200 volts X7R 50 & 100 volts 50, 100 & 200 volts Z5U 50 & 100 volts 50 & 100 volts Temperature Characteristics: C0G 0 ± 30 PPM/°C from - 55°C to + 125°C(1) X7R ± 15% from - 55°C to + 125°C Z5U + 22%; - 56% from + 10°C to + 85°C Capacitance Tolerance: C0G ± 5%, ± 10%, ± 20% X7R ± 10%, ± 20% Z5U ± 20%, - 20 + 80%, - 0 + 100% Construction: Epoxy encapsulated - meets flame test require- ments of UL Standard 94V-0. High-temperature solder - meets EIA RS-198D, Method 302, Condition B (260°C for 10 sec.) Lead Material: Solder Coated Copper Clad Steel Solderability: EIA RS-198D, Method 302, Solder temperature - 230° ± 5°C. Dwell time in solder - 7 ± 1/2 seconds. Terminal Strength: EIA RS-198D, Method 303, Condition A (2.2 kg) ELECTRICAL @ 25°C Capacitance: Within specified tolerance at 25°C and following test conditions. C0G - Greater than 1000 pF with 1.0 vrms at 1 kHz. - 1000 pF and less with 1.0 vrms at 1 MHz. X7R - with 1.0 vrms at 1 kHz. Z5U - with 0.5 vrms at 1 kHz. Dissipation Factor: At 25°C - same test conditions as capacitance. C0G - 0.15% maximum X7R - 2.5% maximum Z5U - 4.0% maximum Insulation Resistance: EIA RS-198D, Method 104, Condition A C0G - 100 gigohms or 1000 megohm x µF, whichever is less. X7R -100 gigohms or 1000 megohm x µF, whichever is less. Z5U -10 gigohms or 1000 megohm x µF, whichever is less. Dielectric Withstanding Voltage: EIA RS-198D, Method 103 (250% of rated voltage for 5 seconds, with current limited to 50mA) ENVIRONMENTAL Vibration: EIA RS-198D, Method 304, Condition D (10-2000 Hz; 20g) Shock: EIA RS-198D, Method 305, Condition I (100g) Life Test: EIA RS-198D, Method 201, Condition D. Test Potential and Temperature. C0G- 200% of rated voltage at + 125°C X7R - 200% of rated voltage at + 125°C Z5U - 200% of rated voltage at + 85°C Post-Test Limits at + 25°C are: Capacitance Change: C0G - ± 3%, or 0.25 pF, whichever is greater. X7R - ± 20% of initial value. (2) Z5U - ± 30% of initial value. (2) Dissipation Factor: C0G - 0.25% maximum X7R - 3.0% maximum Z5U - 4.0% maximum Insulation Resistance: C0G - 10 gigohms or 100 megohm x µF, whichever is less. X7R - 10 gigohms or 100 megohm x µF, whichever is less. Z5U - 1 gigohm or 100 megohm x µF, whichever is less. Moisture Resistance: EIA RS-198D, Method 204, Condition A (10 cycles without applied voltage. Post-Test Limits at + 25°C are: Capacitance Change: C0G - 3%, or 0.25 pF, whichever is greater. X7R - ± 20% of initial value. (2) Z5U - ± 30% of initial value. (2) Dissipation Factor: C0G - 0.25% maximum X7R - 3.0% maximum Z5U - 4.0% maximum Insulation Resistance: C0G - 10 gigohms or 100 megohm x µF, whichever is less. X7R - 10 gigohms or 100 megohm x µF, whichever is less. Z5U - 1 gigohm or 100 megohm x µF, whichever is less. Thermal Shock: EIA RS-198D, Method 202, Condition B (C0G & X7R: - 55°C to + 125°C; Z5U: - 55°C to + 85°C) (1) +53 ppm -30 ppm/°C from + 25°C to - 55°C, ± 60 ppm below 10 pF. (2) X7R & Z5U dielectrics exhibit aging characteristics; therefore, it is highly recommended that capacitors be deaged for 2 hours at 150°C and stabilized at room temperature for 48 hours before capacitance measurements are made. 0988 Layout rev 8/9/2000 9:54 AM Page 5 |
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