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AS9C25512M2018L-250BI Datasheet(PDF) 7 Page - Alliance Semiconductor Corporation

Part # AS9C25512M2018L-250BI
Description  2.5V 512/256K x 18 Synchronous Dual-port SRAM with 3.3V or 2.5V interface
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Manufacturer  ALSC [Alliance Semiconductor Corporation]
Direct Link  https://www.alliancememory.com
Logo ALSC - Alliance Semiconductor Corporation

AS9C25512M2018L-250BI Datasheet(HTML) 7 Page - Alliance Semiconductor Corporation

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AS9C25512M2018L
AS9C25256M2018L
9/24/04, v.1.2
Alliance Semiconductor
P. 7 of 30
®
Signal description
Notes:
1. Subscript 'x' represents 'A' for Port A and 'B' for Port B.
2. OPTx,VDDQx and VDD must be set to appropriate operating levels before applying inputs on the I/Os and controls for that port.
3. OPTx = VDD (2.5V) implies that corresponding port's I/Os, addresses, clock, and controls will operate at 3.3V level and VDDQx must be supplied at 3.3V.
OPTx = VSS (0V) implies that corresponding port's I/Os, addresses, clock, and controls will operate at 2.5V level and VDDQx must be supplied at 2.5V.
Each port can independently operate on either of the VDDQ levels.
4. If unused JTAG inputs may be left unconnected.
5. JTAG, Collision Detection & Interrupt features are not supported in TQFP package.
6. Address A18 is a NC for AS9C25256M2018L.
Signal
I/O Properties
Description
Notes
Port A
Port B
CLKA
CLKB
ICLOCK
Clock. Each port has an independent Clock input that can be of different frequencies. All
inputs except OEx and ZZx are synchronous to the corresponding port’s clock and must meet
setup and hold time about the rising edge of the clock.
1
A0A - A18A
A0B - A18B
I
SYNC
External Address. Sampled on the rising edge of corresponding port clock
6
DQ0A - DQ17A DQ0B - DQ17B I/O
SYNC
Bidirectional data pins
CE0A, CE1A
CE0B, CE1B
ISYNC
Chip enable inputs. Active low and high, respectively. Sampled on the rising edge of
corresponding port clock.
R/WA
R/WB
I
SYNC
Read/Write enable. Drive this pin LOW to write to, or HIGH to Read from the memory array.
BE0A - BE1A
BE0B - BE1B
ISYNC
Byte Enable Inputs. Active low. Asserting these signals enables Read and Write operations to
the corresponding bytes of the memory array. (Refer Byte Control Truth Table)
ADSA
ADSB
ISYNC
Address Strobe Enable.Active low. Loads external address onto the counter. (Refer Counter
Control Truth Table)
INCA
INCB
ISYNC
Address Counter Increment. Active low. Increments the counter value. (Refer Counter Control
Truth Table)
RPTA
RPTB
ISYNC
Address Counter Repeat. Active low. Reloads the counter with the previously loaded external
address.(Refer Counter Control Truth Table)
OEA
OEB
I
ASYNC
Asynchronous output enable. I/O pins are driven when the OE is low and the chip is in Read
mode. A high on OE tristates the I/O pins.
ZZA
ZZB
I
ASYNC
Snooze Mode Input. Places the device in low power mode. Data is retained. This pin has an
internal pull-down and can be floating.
PL/FTA
PL/FTB
ISTATIC
Pipeline/Flow-Through Select. When low, enables single register flow-through mode. When
high, enables double register Pipeline mode. This pin has an internal pull-up and can be left
floating to operate in pipeline mode.
OPTA
OPTB
ISTATIC
VDDQx Option. OPTx selects the operating voltage levels for the I/Os, addresses, clock, and
controls on that port. This pin has an internal pull-up and can be left floating to operate in 3.3V
mode.
1,2,3
INTA
INTB
OSYNC
Interrupt Flag. Used for message passing between two ports. (Refer Interrupt Logic Truth
Table)
5
COLA
COLB
OSYNC
Collision Alert Flag. Used to indicate collision during simultaneous memory access to the
same location by both the ports (Refer Collision Detection Truth Table)
5
VDDQA
VDDQB
I
POWER
Power to I/O bus. Can be 3.3V or 2.5V depending on OPTx input.
1,2,3
VDD
I
POWER
Power Inputs (To be connected to 2.5V Power supply)
2
VSS
I
GROUND Ground Inputs (To be connected to Ground supply)
TCK
I
CLOCK
(JTAG)
JTAG Test Clock Input. All JTAG signals except TRST are synchronous to this clock.
4,5
TDI
I
SYNC
(JTAG)
JTAG Test Data Input. Data on the TDI input will be shifted serially into selected registers.
4,5
TDO
O
SYNC
(JTAG)
JTAG Test Data Output. TDO transitions occur on the falling edge of TCK. TDO is normally
tristated except when the captured data is shifted out of the JTAG TAP.
5
TMS
I
SYNC
(JTAG)
JTAG Test Mode Select Input. It controls the JTAG TAP state machine. State machine
transitions occur on the rising edge of TCK.
4,5
TRST
I
ASYNC
(JTAG)
JTAG Test Reset Input. Asynchronous input used to initialize TAP controller.
4,5


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